Shubham, Simon
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2

Tinted semi‐transparent solar panels allow concurrent produ..:

Thompson, Elinor ; Bombelli, EL ; Simon, Shubham...
http://gala.gre.ac.uk/id/eprint/28472/13/28472%20THOMPSON_Tinted_Semi-transparent_Solar_Panels_For_Agrivoltaic_Installation_%28OA%29_2020.pdf.  , 2020
 
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Comprehensive Modeling of Switching Behavior in BEOL FeFET ..:

Kumar, Shubham ; Thomann, Simon ; Prakash, Om...
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 368-373 , 2024
 
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7

Cross-Layer Reliability Modeling of Dual-Port FeFET: Device..:

Kumar, Shubham ; Chatterjee, Swetaki ; Thomann, Simon..
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  7 - p. 2891-2903 , 2023
 
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8

Impact of Phase-Change Memory Drift on Energy Efficiency an..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Frank, Martin M. ; Li, Ning ; Rasch, Malte J.... - p. 1-10 , 2023
 
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9

Binding of uranyl cations to a Zr-based metal-organic frame..:

Liu, Yuan ; Ta, An T. ; Pandey, Shubham...
Computational Materials Science.  230 (2023)  - p. 112528 , 2023
 
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Compact and High-Performance TCAM Based on Scaled Double-Ga..:

, In: 2023 60th ACM/IEEE Design Automation Conference (DAC),
Liu, Liu ; Kumar, Shubham ; Thomann, Simon.. - p. 1-6 , 2023
 
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13

Cross-layer FeFET Reliability Modeling for Robust Hyperdime..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
 
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