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Shyue-Kung Lu
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1

Efficient built-in redundancy analysis for embedded memorie..:

Shyue-Kung Lu ; Yu-Chen Tsai ; Hsu, C.-H...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  14 (2006)  1 - p. 34-42 , 2006
Link: https://doi.org/10.1109/..
 
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2

Design-for-testability and fault-tolerant techniques for FF..:

Shyue-Kung Lu ; Jen-Sheng Shih ; Shih-Chang Huang
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  13 (2005)  6 - p. 732-741 , 2005
Link: https://doi.org/10.1109/..
 
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3

C-testable design techniques for iterative logic arrays:

Shyue-Kung Lu ; Jen-Chuan Wang ; Cheng-Wen Wu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  3 (1995)  1 - p. 146-152 , 1995
Link: https://doi.org/10.1109/..
 
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4

A DfT Technique for Electrical Interconnect Testing of Circ..:

, In: 2023 IEEE CPMT Symposium Japan (ICSJ),
Ikiri, Yuki ; Yotsuyanagi, Hiroyuki ; Ali, Fara Ashikin Binti.. - p. 113-116 , 2023
Link: https://doi.org/10.1109/..
 
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5

Integrated Progressive Built-In Self-Repair (IPBISR) Techni..:

, In: 2023 IEEE International Test Conference in Asia (ITC-Asia),
Lu, Shyue-Kung ; Dong, Xin - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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6

E3C Techniques for Protecting NAND Flash Memories:

Lu, Shyue-Kung ; Tsai, Zeng-Long
Journal of Electronic Testing.  39 (2023)  4 - p. 487-500 , 2023
Link: https://doi.org/10.1007/..
 
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7

Enhanced Interconnect Test Method for Resistive Open Defect..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Ohmatsu, Masao ; Ohtera, Yuto ; Ikiri, Yuki... - p. 49-53 , 2022
Link: https://doi.org/10.1109/..
 
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8

Fault Securing Techniques for Yield and Reliability Enhance..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Lu, Shyue-Kung ; Liu, Zhi-Jia ; Hashizume, Masaki - p. 13-18 , 2022
Link: https://doi.org/10.1109/..
 
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9

Fault Resilience Techniques for Flash Memory of DNN Acceler..:

, In: 2022 IEEE International Test Conference (ITC),
Lu, Shyue-Kung ; Wu, Yu-Sheng ; Hong, Jin-Hua. - p. 591-600 , 2022
Link: https://doi.org/10.1109/..
 
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10

Fault Resilience Techniques for Flash Memory of DNN Acceler..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Lu, Shyue-Kung ; Wu, Yu-Sheng ; Hong, Jin-Hua. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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11

Effective Switching Probability Calculation to Locate Hotsp..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Utsunomiya, Taiki ; Hoshino, Ryu ; Miyase, Kohei... - p. 43-48 , 2022
Link: https://doi.org/10.1109/..
 
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12

Detectability of Open Defects at Interconnects between Dies..:

, In: 2022 IEEE CPMT Symposium Japan (ICSJ),
Ohmatsu, Masao ; Sako, Fumiya ; Ikiri, Yuki... - p. 94-95 , 2022
Link: https://doi.org/10.1109/..
 
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13

Fine-Grained Built-In Self-Repair Techniques for NAND Flash..:

, In: 2022 IEEE International Test Conference (ITC),
Lu, Shyue-Kung ; Tseng, Shi-Chun ; Miyase, Kohei - p. 391-399 , 2022
Link: https://doi.org/10.1109/..
 
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14

Fault-Aware Dependability Enhancement Techniques for Phase ..:

Lu, Shyue-Kung ; Li, Hui-Ping ; Miyase, Kohei..
Journal of Electronic Testing.  37 (2021)  4 - p. 503-513 , 2021
Link: https://doi.org/10.1007/..
 
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15

Fault-Aware ECC Techniques for Reliability Enhancement of F..:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Lu, Shyue-Kung ; Tsai, Zeng-Long ; Hsu, Chun-Lung. - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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