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Sijbrandij, S. J.
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1

Imaging Contrast with Multiple Ion Beams – RETRACTION:

Wu, H ; Sijbrandij, S ; McVey, S.
Microscopy and Microanalysis.  21 (2015)  S3 - p. E4 , 2015
Link: https://doi.org/10.1017/..
 
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2

Study and optimisation of SIMS performed with He+ and Ne+ b..:

Pillatsch, L. ; Vanhove, N. ; Dowsett, D....
Applied Surface Science.  282 (2013)  - p. 908-913 , 2013
Link: https://doi.org/10.1016/..
 
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3

Towards SIMS on the Helium Ion Microscope: Detection Limits..:

Dowsett, D. ; Pillatsch, L. ; Vanhove, N....
Microscopy and Microanalysis.  19 (2013)  S2 - p. 354-355 , 2013
Link: https://doi.org/10.1017/..
 
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4

Towards secondary ion mass spectrometry on the helium ion m..:

Wirtz, T. ; Vanhove, N. ; Pillatsch, L....
Applied Physics Letters.  101 (2012)  4 - p. 041601 , 2012
Link: https://doi.org/10.1063/..
 
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5

Towards Secondary Ion Mass Spectrometry On The Helium Ion M..:

Wirtz, T. ; Pillatsch, L. ; Vanhove, N....
Microscopy and Microanalysis.  18 (2012)  S2 - p. 812-813 , 2012
Link: https://doi.org/10.1017/..
 
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6

Advances in High Resolution Helium Ion Microscope (HIM) Ima..:

Sanford, C ; Notte, J ; Scipioni, L...
Microscopy and Microanalysis.  15 (2009)  S2 - p. 654-655 , 2009
Link: https://doi.org/10.1017/..
 
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7

A New Detector for Backscattered Helium Ions in the 30 keV ..:

Sijbrandij, S ; Notte, J ; Thompson, B...
Microscopy and Microanalysis.  15 (2009)  S2 - p. 220-221 , 2009
Link: https://doi.org/10.1017/..
 
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8

A novel approach to gaseous field ion sources for focused i..:

Miller, M.K ; Sijbrandij, S.J
Ultramicroscopy.  79 (1999)  1-4 - p. 225-230 , 1999
Link: https://doi.org/10.1016/..
 
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9

Performance of a microsphere plate electron multiplier in A..:

Sijbrandij, S.J ; Miller, M.K
Ultramicroscopy.  79 (1999)  1-4 - p. 265-271 , 1999
Link: https://doi.org/10.1016/..
 
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10

Tempering of Iron-Carbon-Nitrogen Martensites: (Re) Distrib..:

Böttger, A. ; Warren, Paul J. ; Smith, George D.W....
Materials Science Forum.  318-320 (1999)  - p. 103-108 , 1999
Link: https://doi.org/10.4028/..
 
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11

Performance of an energy-compensated three-dimensional atom..:

Cerezo, A. ; Godfrey, T. J. ; Sijbrandij, S. J...
Review of Scientific Instruments.  69 (1998)  1 - p. 49-58 , 1998
Link: https://doi.org/10.1063/..
 
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12

Atom probe analysis of nickel-based superalloy IN-718 with ..:

Sijbrandij, S.J ; Miller, M.K ; Horton, J.A.
Materials Science and Engineering: A.  250 (1998)  1 - p. 115-119 , 1998
Link: https://doi.org/10.1016/..
 
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13

Digital Field Ion Microscopy:

Sijbrandij, S. J. ; Russell, K. F. ; Thomson, R. C..
Microscopy and Microanalysis.  4 (1998)  S2 - p. 88-89 , 1998
Link: https://doi.org/10.1017/..
 
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14

Atom Probe Field Ion Microscopy of High Resistivity Materia..:

Sijbrandij, S. J. ; Larson, D. J. ; Miller, M. K.
Microscopy and Microanalysis.  4 (1998)  S2 - p. 90-91 , 1998
Link: https://doi.org/10.1017/..
 
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15

Atomprobe analysis of initial decomposition of Fe-N martens..:

Genderen, M. J. van ; Sijbrandij, S. J. ; Böttger, A...
Materials Science and Technology.  13 (1997)  10 - p. 806-812 , 1997
Link: https://doi.org/10.1179/..
 
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