Sills, Scott
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1

Boron-Implanted Silicon Substrates for Physical Adsorption ..:

Takabayashi, Sadao ; Kotani, Shohei ; Flores-Estrada, Juan...
International Journal of Molecular Sciences.  19 (2018)  9 - p. 2513 , 2018
 
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2

Physical adsorption and surface diffusion of DNA origami on..:

, In: 2017 IEEE Workshop on Microelectronics and Electron Devices (WMED),
 
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3

Postcycling Degradation in Metal-Oxide Bipolar Resistive Sw..:

Wang, Zhongqiang ; Ambrogio, Stefano ; Balatti, Simone...
IEEE Transactions on Electron Devices.  63 (2016)  11 - p. 4279-4287 , 2016
 
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4

Engineering ReRAM for high-density applications:

Calderoni, Alessandro ; Sills, Scott ; Cardon, Chris..
Microelectronic Engineering.  147 (2015)  - p. 145-150 , 2015
 
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5

High-density reRAM for storage class memory:

, In: 2015 15th Non-Volatile Memory Technology Symposium (NVMTS),
 
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7

Molecular Origins of Elastomeric Friction:

, In: Fundamentals of Friction and Wear; NanoScience and Technology,
 
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8

Probing Macromolecular Dynamics and the Influence of Finite..:

, In: Applied Scanning Probe Methods III; NanoScience and Technology,
Sills, Scott ; Overney, René M. - p. 83-130 , 2006
 
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12

Interfacial glass transition profiles in ultrathin, spin ca..:

Sills, Scott ; Overney, René M. ; Chau, Wilson...
The Journal of Chemical Physics.  120 (2004)  11 - p. 5334-5338 , 2004
 
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14

Molecular Mobility and Interfacial Dynamics in Organic Nano..:

Sills, Scott E. ; Overney, René M.
Journal of Adhesion Science and Technology.  24 (2010)  15-16 - p. 2641-2667 , 2010
 
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