E-LIB Suche - Ergebnisse für: Simoen, E.

1

Corrigendum to "In-depth static and low frequency noise ass..:

Cretu, B. ; Veloso, A. ; Simoen, E.
Solid-State Electronics. 207 (2023) - p. 108666 , 2023

Link: https://doi.org/10.1016/..

2

Is there a limit when the access resistance impact on the e..:

Tahiat, A. ; Cretu, B. ; Veloso, A..
Solid-State Electronics. 209 (2023) - p. 108711 , 2023

Link: https://doi.org/10.1016/..

3

Novel Y-function based strategy for parameter extraction in..:

Tahiat, A. ; Cretu, B. ; Veloso, A..
Solid-State Electronics. 209 (2023) - p. 108709 , 2023

Link: https://doi.org/10.1016/..

4

In-depth static and low frequency noise assessment of p-cha..:

Cretu, B. ; Veloso, A. ; Simoen, E.
Solid-State Electronics. 201 (2023) - p. 108591 , 2023

Link: https://doi.org/10.1016/..

5

Evaluation of n-type gate-all-around vertically-stacked nan..:

Silva, V.C.P. ; Martino, J.A. ; Simoen, E...
Solid-State Electronics. 208 (2023) - p. 108729 , 2023

Link: https://doi.org/10.1016/..

6

Linking Room- and Low-Temperature Electrical Performance of..:

Kao, K.-H. ; Godfrin, C. ; Elsayed, A....
IEEE Electron Device Letters. 43 (2022) 5 - p. 674-677 , 2022

Link: https://doi.org/10.1109/..

7

Insights into Scaled Logic Devices Connected from Both Wafe..:

, In: 2022 International Electron Devices Meeting (IEDM),

Veloso, A. ; Eneman, G. ; Matagne, P.... - p. 23.3.1-23.3.4 , 2022

Link: https://doi.org/10.1109/..

8

DC and low a frequency noise analysis of p channel gate all..:

Cretu, B. ; Veloso, A. ; Simoen, E.
Solid-State Electronics. 194 (2022) - p. 108360 , 2022

Link: https://doi.org/10.1016/..

9

Detailed low frequency noise assessment on GAA NW n-channel..:

Cretu, B. ; Bordin, A. ; Simoen, E....
Solid-State Electronics. 181-182 (2021) - p. 108029 , 2021

Link: https://doi.org/10.1016/..

10

Gate dielectric material influence on DC behavior of MO(I)S..:

Agopian, P.G.D. ; Carmo, G.J. ; Martino, J.A....
Solid-State Electronics. 185 (2021) - p. 108091 , 2021

Link: https://doi.org/10.1016/..

11

Comparison of Electrical Performance of Co-Integrated Forks..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),

Ritzenthaler, R. ; Mertens, H. ; Eneman, G.... - p. 26.2.1-26.2.4 , 2021

Link: https://doi.org/10.1109/..

12

A Deep Level Transient Spectroscopy Study of Hole Traps in ..:

Hsu, P.-C. ; Simoen, E. ; Lin, D....
ECS Journal of Solid State Science and Technology. 9 (2020) 4 - p. 044006 , 2020

Link: https://doi.org/10.1149/..

13

Deep-Level Transient Spectroscopy of GaAs Nanoridge Diodes ..:

Syshchyk, O. ; Hsu, B. ; Yu, H....
Physical Review Applied. 14 (2020) 2 - p. , 2020

Link: https://doi.org/10.1103/..

14

Characterization of defect states in Mg-doped GaN-on-Si p+n..:

Lechaux, Y ; Minj, A ; Méchin, L...
Semiconductor Science and Technology. 36 (2020) 2 - p. 024002 , 2020

Link: https://doi.org/10.1088/..

15

Electrical Activity of Extended Defects in Relaxed InxGa1−x..:

Claeys, C. ; Hsu, P.-C. ; Mols, Y....
ECS Journal of Solid State Science and Technology. 9 (2020) 3 - p. 033001 , 2020

Link: https://doi.org/10.1149/..