E-LIB Suche - Ergebnisse für: Sin, Y.

1

Electrically injected 164µm emitting In065Ga035As 3-QW lase..:

Kim, H. ; Shi, B. ; Lingley, Z....
Optics Express. 27 (2019) 23 - p. 33205 , 2019

Link: https://doi.org/10.1364/..

2

Catastrophic Degradation in High-Power Buried Heterostructu..:

, In: 2019 Conference on Lasers and Electro-Optics (CLEO),

Sin, Y. ; Lingley, Z. ; Brodie, M.... - p. 1-2 , 2019

Link: https://doi.org/10.1364/..

3

Bismuth Particle Formation in Annealed Dilute GaAs i-x-y P ..:

Lingley, Z. R. ; Foran, B. ; Brodie, M....
Microscopy and Microanalysis. 22 (2016) S3 - p. 1578-1579 , 2016

Link: https://doi.org/10.1017/..

4

(Invited) Dilute-Nitride-Antimonide Materials Grown by MOVP..:

Mawst, Luke J ; Kim, T. W. ; Kim, H....
ECS Transactions. 66 (2015) 7 - p. 101-108 , 2015

Link: https://doi.org/10.1149/..

5

Strain-compensated GaAs1−yPy/GaAs1−zBiz/GaAs1−yPyquantum we..:

Kim, H ; Forghani, K ; Guan, Y...
Semiconductor Science and Technology. 30 (2015) 9 - p. 094011 , 2015

Link: https://doi.org/10.1088/..

6

Impact of thermal annealing on bulk InGaAsSbN materials gro..:

Kim, T. W. ; Kim, K. ; Lee, J. J....
Applied Physics Letters. 104 (2014) 5 - p. , 2014

Link: https://doi.org/10.1063/..

7

Properties of 'bulk' GaAsSbN/GaAs for multi-junction solar ..:

Kim, T.W. ; Forghani, K. ; Mawst, L.J....
Journal of Crystal Growth. 393 (2014) - p. 70-74 , 2014

Link: https://doi.org/10.1016/..

8

Characteristics of bulk InGaAsSbN/GaAs grown by metalorgani..:

Kim, T.W. ; Garrod, T.J. ; Mawst, L.J....
Journal of Crystal Growth. 370 (2013) - p. 163-167 , 2013

Link: https://doi.org/10.1016/..

9

Narrow band gap (1 eV) InGaAsSbN solar cells grown by metal..:

Kim, T. W. ; Garrod, T. J. ; Kim, K....
Applied Physics Letters. 100 (2012) 12 - p. , 2012

Link: https://doi.org/10.1063/..

10

Disruption of the cyclic AMP phosphodiesterase-4 (PDE4)–HSP..:

Sin, Y.Y. ; Edwards, H.V. ; Li, X....
Journal of Molecular and Cellular Cardiology. 50 (2011) 5 - p. 872-883 , 2011

Link: https://doi.org/10.1016/..

11

Electron Beam Induced Current Characterization of Dark Line..:

Mason, M ; Presser, N ; Sin, Y..
Microscopy and Microanalysis. 16 (2010) S2 - p. 794-795 , 2010

Link: https://doi.org/10.1017/..

12

Tomographic Characterization of Dislocations in Failure Reg..:

Foran, B ; Ives, N ; Yeoh, T...
Microscopy and Microanalysis. 15 (2009) S2 - p. 598-599 , 2009

Link: https://doi.org/10.1017/..

13

EBIC Targeting for Dual Beam FIB Based TEM Sample Preparati..:

Presser, N ; Foran, B ; Sin, Y..
Microscopy and Microanalysis. 14 (2008) S2 - p. 392-393 , 2008

Link: https://doi.org/10.1017/..

14

Thermally Driven Chemical Diffusion and Failure of InGaAs-A..:

Foran, B ; Presser, N ; Sin, Y.
Microscopy and Microanalysis. 13 (2007) S02 - p. , 2007

Link: https://doi.org/10.1017/..

15

Molecular interfacial engineering of adhesion between polyf..:

Wong, K.W. ; Sin, L.Y. ; Yeung, M.K...
Applied Physics A. 87 (2007) 1 - p. 23-26 , 2007

Link: https://doi.org/10.1007/..