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Sinthiptharakoon, K.
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1

Conductive scanning probe microscopy of the semicontinuous ..:

Sinthiptharakoon, K. ; Sapcharoenkun, C. ; Nuntawong, N....
Applied Surface Science.  441 (2018)  - p. 364-371 , 2018
Link: https://doi.org/10.1016/..
 
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2

Exact location of dopants below the Si(001): H surface from..:

Brazdova, V ; Bowler, DR ; Sinthiptharakoon, K...
https://discovery.ucl.ac.uk/id/eprint/1518511/1/PhysRevB.95.075408.pdf.  , 2017
Link: https://discovery.ucl.ac..
 
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3

Investigation of individual donors in silicon at cryogenic ..:

Sinthiptharakoon, K
https://discovery.ucl.ac.uk/id/eprint/1460900/1/PhDThesis_Sinthiptharakoon_K.pdf.  , 2015
Link: https://discovery.ucl.ac..
 
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4

Investigating individual arsenic dopant atoms in silicon us..:

Sinthiptharakoon, K ; Schofield, SR ; Studer, P...
https://discovery.ucl.ac.uk/id/eprint/1404597/1/0953-8984_26_1_012001.pdf.  , 2014
Link: https://discovery.ucl.ac..
 
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