Smets, Q.
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3

Impact of gate stack processing on the hysteresis of 300 mm..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Panarella, L. ; Kaczer, B. ; Smets, Q.... - p. 1-6 , 2023
 
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4

Towards low damage and fab-compatible top-contacts in MX2 t..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Kundu, S. ; van Dorp, D. H. ; Schram, T.... - p. 1-2 , 2023
 
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5

Integration of epitaxial monolayer MX₂ channels on 300mm wa..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Ghosh, S. ; Smets, Q. ; Banerjee, S.... - p. 1-2 , 2023
 
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6

Exploring manufacturability of novel 2D channel materials: ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Dorow, C. J. ; Schram, T. ; Smets, Q.... - p. 1-4 , 2023
 
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7

Analysis of BTI in 300 mm integrated dual-gate WS2 FETs:

, In: 2022 Device Research Conference (DRC),
Panarella, L. ; Smets, Q. ; Verreck, D.... - p. 1-2 , 2022
 
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8

Understanding and modelling the PBTI reliability of thin-fi..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Chasin, A. ; Franco, J. ; Triantopoulos, K.... - p. 31.1.1-31.1.4 , 2021
 
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9

Scaled transistors with 2D materials from the 300mm fab:

, In: 2020 IEEE Silicon Nanoelectronics Workshop (SNW),
Asselberghs, I. ; Schram, T. ; Smets, Q.... - p. 67-68 , 2020
 
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10

Tunnel FETs using Phosphorene/ReS2 heterostructures:

, In: 2019 Device Research Conference (DRC),
Balaji, Y. ; Smets, Q. ; Lin, D.... - p. 113-114 , 2019
 
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11

Experimental calibration of the temperature dependence of t..:

, In: 2019 Device Research Conference (DRC),
Bizindavyi, J. ; Verhulst, A. S. ; Smets, Q... - p. 253-254 , 2019
 
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13

Analog parameters of solid source Zn diffusion InXGa1−XAs n..:

Bordallo, C ; Martino, J A ; Agopian, P G D...
Semiconductor Science and Technology.  31 (2016)  12 - p. 124001 , 2016
 
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