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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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Impact of gate stack processing on the hysteresis of 300 mm..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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Towards low damage and fab-compatible top-contacts in MX2 t..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
5
Integration of epitaxial monolayer MX₂ channels on 300mm wa..:
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2023 International Electron Devices Meeting (IEDM) ,
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Exploring manufacturability of novel 2D channel materials: ..:
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2022 Device Research Conference (DRC) ,
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Analysis of BTI in 300 mm integrated dual-gate WS2 FETs:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
8
Understanding and modelling the PBTI reliability of thin-fi..:
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2020 IEEE Silicon Nanoelectronics Workshop (SNW) ,
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Scaled transistors with 2D materials from the 300mm fab:
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2019 Device Research Conference (DRC) ,
10
Tunnel FETs using Phosphorene/ReS2 heterostructures:
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2019 Device Research Conference (DRC) ,
11