I agree that this site is using cookies. You can find further informations here.
X
Snugovsky, Polina
6  results:
Search for persons X
?
1

Tin Whisker Growth on Electronic Assemblies Soldered with B..:

Delhaise, André M. ; Bagheri, Zohreh ; Meschter, Stephan..
Journal of Electronic Materials.  50 (2020)  3 - p. 842-854 , 2020
Link: https://doi.org/10.1007/..
 
?
2

Thermal Preconditioning and Restoration of Bismuth-Containi..:

Delhaise, André M. ; Snugovsky, Polina ; Kennedy, Jeff...
Journal of Electronic Materials.  49 (2019)  1 - p. 116-127 , 2019
Link: https://doi.org/10.1007/..
 
?
3

Whisker Formation Induced by Component and Assembly Ionic C..:

Snugovsky, Polina ; Meschter, Stephan ; Bagheri, Zohreh...
Journal of Electronic Materials.  41 (2011)  2 - p. 204-223 , 2011
Link: https://doi.org/10.1007/..
 
?
4

Microstructure and Reliability Comparison of Different Pb-F..:

Snugovsky, Polina ; Bagheri, Zohreh ; Hamilton, Craig
Journal of Electronic Materials.  38 (2009)  12 - p. 2628-2646 , 2009
Link: https://doi.org/10.1007/..
 
?
5

Microstructure, Defects, and Reliability of Mixed Pb-Free/S..:

Snugovsky, Polina ; McCormick, Heather ; Bagheri, Simin...
Journal of Electronic Materials.  38 (2008)  2 - p. 292-302 , 2008
Link: https://doi.org/10.1007/..
 
?
6

Temperature profile effects in accelerated thermal cycling ..:

Qi, Yan ; Lam, Rex ; Ghorbani, Hamid R...
Microelectronics Reliability.  46 (2006)  2-4 - p. 574-588 , 2006
Link: https://doi.org/10.1016/..
 
1-6