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Sochacki, Mariusz
33  results:
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1

The Preparation and Properties of a Hydrogen-Sensing Field-..:

Firek, Piotr ; Czerwosz, Elżbieta ; Wronka, Halina...
Energies.  17 (2024)  13 - p. 3261 , 2024
Link: https://doi.org/10.3390/..
 
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2

A comparative analysis of printed circuit drying methods fo..:

Ciszewski, Piotr ; Sochacki, Mariusz ; Stęplewski, Wojciech...
Microelectronics Reliability.  129 (2022)  - p. 114478 , 2022
Link: https://doi.org/10.1016/..
 
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3

A Review: Inductively Coupled Plasma Reactive Ion Etching o..:

Racka-Szmidt, Katarzyna ; Stonio, Bartłomiej ; Żelazko, Jarosław..
Materials.  15 (2021)  1 - p. 123 , 2021
Link: https://doi.org/10.3390/..
 
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4

Development of assembly techniques for connection of AlGaN/..:

Kisiel, Ryszard ; Guziewicz, Marek ; Taube, Andrzej..
Circuit World.  47 (2020)  2 - p. 146-152 , 2020
Link: https://doi.org/10.1108/..
 
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5

Influence of the Interactions at the Graphene–Substrate Bou..:

Nowak, Dorota ; Clapa, Marian ; Kula, Piotr...
Materials.  12 (2019)  23 - p. 3949 , 2019
Link: https://doi.org/10.3390/..
 
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6

Influence of Atomic Layer Deposition Temperature on the Ele..:

Król, Krystian ; Sochacki, Mariusz ; Taube, Andrzej...
physica status solidi (a).  215 (2018)  13 - p. , 2018
Link: https://doi.org/10.1002/..
 
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7

Electrical properties of isotype and anisotype ZnO/4H-SiC h..:

Taube, Andrzej ; Sochacki, Mariusz ; Kwietniewski, Norbert...
Applied Physics Letters.  110 (2017)  14 - p. , 2017
Link: https://doi.org/10.1063/..
 
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8

Electrical characterization of ZnO/4H‐SiC n–p heterojunctio..:

Kwietniewski, Norbert ; Masłyk, Monika ; Werbowy, Aleksander...
physica status solidi (a).  213 (2016)  5 - p. 1120-1124 , 2016
Link: https://doi.org/10.1002/..
 
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9

Interface traps in Al/HfO2/SiO2/4H-SiC metal-insulator-semi..:

Sochacki, Mariusz ; Krol, Krystian ; Waskiewicz, Michal..
Microelectronic Engineering.  157 (2016)  - p. 46-51 , 2016
Link: https://doi.org/10.1016/..
 
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10

3D photodetecting structure with adjustable sensitivity rat..:

Kociubiński, Andrzej ; Borecki, Michał ; Duk, Mariusz..
Microelectronic Engineering.  154 (2016)  - p. 48-52 , 2016
Link: https://doi.org/10.1016/..
 
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11

Influence of Phosphorus Implantation on Electrical Properti..:

Krol, Krystian ; Sochacki, Mariusz ; Turek, Marcin...
Materials Science Forum.  821-823 (2015)  - p. 496-499 , 2015
Link: https://doi.org/10.4028/..
 
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12

Chlorine-enhanced thermal oxides growth and significant tra..:

Król, Krystian ; Sochacki, Mariusz ; Strupinski, Włodzimierz...
Thin Solid Films.  591 (2015)  - p. 86-89 , 2015
Link: https://doi.org/10.1016/..
 
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13

Temperature-dependent electrical characterization of high-v..:

Taube, Andrzej ; Kaczmarski, Jakub ; Kruszka, Renata...
Solid-State Electronics.  111 (2015)  - p. 12-17 , 2015
Link: https://doi.org/10.1016/..
 
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14

Modelling and Simulation of Normally-Off AlGaN/GaN MOS-HEMT:

Taube, Andrzej ; Sochacki, Mariusz ; Szmidt, Jan..
International Journal of Electronics and Telecommunications.  60 (2014)  3 - p. 253-258 , 2014
Link: https://doi.org/10.2478/..
 
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15

Influence of Nitrogen Implantation on Electrical Properties..:

Król, Krystian ; Sochacki, Mariusz ; Turek, Marcin...
Materials Science Forum.  740-742 (2013)  - p. 733-736 , 2013
Link: https://doi.org/10.4028/..
 
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