E-LIB Suche - Ergebnisse für: Sogoyan, Armen V.

1

Some aspects of IC radiation hardness evaluation when expos..:

Chumakov, Alexander I. ; Sogoyan, Armen V. ; Bobrovsky, Dmitry V....
Bezopasnost informacionnyh tehnology. 28 (2021) 2 - p. 34-43 , 2021

Link: https://doi.org/10.26583..

2

Single event rate estimation based on limited experimental ..:

, In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Sogoyan, Armen V. ; Smolin, Anatoly A. ; Chumakov, Alexander I. - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

3

The influence of high ionizing dose rate on CMOS IC radiati..:

Kalashnikov, Vladislav D. ; Egorov, Alexey Yu. ; Sogoyan, Armen V....
Bezopasnost informacionnyh tehnology. 27 (2020) 3 - p. 98-103 , 2020

Link: https://doi.org/10.26583..

4

Single event effects qualificatoin of integrated circuits:

Sogoyan, Armen V. ; Smolin, Anatoly A. ; Chumakov, Alexander I.
Bezopasnost informacionnyh tehnology. 27 (2020) 1 - p. 68-82 , 2020

Link: https://doi.org/10.26583..

5

Hardness assurance levels and requirements for single event..:

Chumakov, Alexander I. ; Sogoyan, Armen V. ; Smolin, Anatoly A....
Bezopasnost informacionnyh tehnology. 27 (2020) 1 - p. 83-97 , 2020

Link: https://doi.org/10.26583..

6

Application of effective LET approach for modern CMOS devic..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Akhmetov, Alexey O. ; Bobrovsky, Dmitriy V. ; Smolin, Anatoly A... - p. 1-4 , 2019

Link: https://doi.org/10.1109/..

7

Two-Parameter Model for SEE Rate Estimation:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Smolin, Anatoly A. ; Sogoyan, Armen V. ; Chumakov, Alexander I. - p. 1-4 , 2018

Link: https://doi.org/10.1109/..

8

SEE rate estimation based on diffusion approximation of cha..:

Sogoyan, Armen V. ; Chumakov, Alexander I. ; Smolin, Anatoly A.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 418 (2018) - p. 87-93 , 2018

Link: https://doi.org/10.1016/..

9

A simple analytical model of single-event upsets in bulk CM..:

Sogoyan, Armen V. ; Chumakov, Alexander I. ; Smolin, Anatoly A...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 400 (2017) - p. 31-36 , 2017

Link: https://doi.org/10.1016/..

10

Method for integrated circuits total ionizing dose hardness..:

Sogoyan V., Armen ; Artamonov S., Alexey ; Nikiforov Y., Alexander.
Facta universitatis - series: Electronics and Energetics. 27 (2014) 3 - p. 329-338 , 2014

Link: https://doi.org/10.2298/..

11

METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS..:

Sogoyan, Armen V ; Artamonov, Alexey S ; Nikiforov, Aleksander Y.
http://casopisi.junis.ni.ac.rs/index.php/FUElectEnerg/article/view/299/143. , 2014

Link: http://casopisi.junis.ni..

12

Some aspects of IC radiation hardness evaluation when expos..:

Alexander I. Chumakov ; Armen V. Sogoyan ; Dmitry V. Bobrovsky...
https://bit.mephi.ru/index.php/bit/article/view/1338. , 2021

Link: https://doi.org/10.26583..

13

The influence of high ionizing dose rate on CMOS IC radiati..:

Vladislav D. Kalashnikov ; Alexey Yu. Egorov ; Armen V. Sogoyan...
https://bit.mephi.ru/index.php/bit/article/view/1296. , 2020

Link: https://doi.org/10.26583..

14

Hardness assurance levels and requirements for single event..:

Alexander I. Chumakov ; Armen V. Sogoyan ; Anatoly A. Smolin...
https://bit.mephi.ru/index.php/bit/article/view/1254. , 2020

Link: https://doi.org/10.26583..

15

Single event effects qualificatoin of integrated circuits:

Armen V. Sogoyan ; Anatoly A. Smolin ; Alexander I. Chumakov
https://bit.mephi.ru/index.php/bit/article/view/1253. , 2020

Link: https://doi.org/10.26583..