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2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) ,
4
Defect Density Reduction of Thin SiO2 MOSFET through Oxidat..:
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2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE) ,
10
Negative bias temperature instability characterization and ..:
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2017 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) ,
15