E-LIB Suche - Ergebnisse für: Soloviev, Stanislav I.

1

Bipolar Degradation in 4H-SiC Thyristors:

Soloviev, Stanislav I. ; Losee, Peter A. ; Arthur, Stephen...
Materials Science Forum. 717-720 (2012) - p. 1175-1178 , 2012

Link: https://doi.org/10.4028/..

2

Silicon Carbide Ultraviolet Photodetector Modeling, Design ..:

Akturk, Akin ; Dandin, Marc ; Vert, Alexey V....
Materials Science Forum. 717-720 (2012) - p. 1199-1202 , 2012

Link: https://doi.org/10.4028/..

3

Advances in Silicon Carbide Single Photon Detectors:

Vert, Alexey V. ; Soloviev, Stanislav I. ; Sandvik, Peter M.
Materials Science Forum. 679-680 (2011) - p. 543-546 , 2011

Link: https://doi.org/10.4028/..

4

Performance of Silicon Carbide Avalanche Photodiode Arrays ..:

Vert, Alexey V. ; Soloviev, Stanislav I. ; Sandvik, Peter M.
Materials Science Forum. 645-648 (2010) - p. 1069-1072 , 2010

Link: https://doi.org/10.4028/..

5

Characterisation of Low Noise 4H-SiC Avalanche Photodiodes:

Green, James E. ; Loh, W.S. ; David, John P.R....
Materials Science Forum. 645-648 (2010) - p. 1081-1084 , 2010

Link: https://doi.org/10.4028/..

6

Influence of Defects in 4H-SiC Avalanche Photodiodes on Gei..:

Vert, Alexey V. ; Soloviev, Stanislav I. ; Fronheiser, Jody.
Materials Science Forum. 615-617 (2009) - p. 877-880 , 2009

Link: https://doi.org/10.4028/..

7

Positive Temperature Coefficient of Avalanche Breakdown Obs..:

Soloviev, Stanislav I. ; Vert, Alexey V. ; Fronheiser, Jody.
Materials Science Forum. 615-617 (2009) - p. 865-868 , 2009

Link: https://doi.org/10.4028/..

8

Temperature Dependence of Hole Impact Ionization Coefficien..:

Loh, W.S. ; David, John P.R. ; Ng, B.K....
Materials Science Forum. 615-617 (2009) - p. 311-314 , 2009

Link: https://doi.org/10.4028/..

9

Solar-Blind 4H-SiC Avalanche Photodiodes:

Soloviev, Stanislav I. ; Vert, Alexey V. ; Fronheiser, Jody.
Materials Science Forum. 615-617 (2009) - p. 873-876 , 2009

Link: https://doi.org/10.4028/..

10

Observation of Luminescence from Defects in 4H-SiC APDs Ope..:

Soloviev, Stanislav I. ; Sandvik, Peter M. ; Vertiatchikh, Alexey..
Materials Science Forum. 600-603 (2008) - p. 1211-1214 , 2008

Link: https://doi.org/10.4028/..

11

Correlation between Thermal Oxide Breakdown and Defects in ..:

Soloviev, Stanislav I. ; Matocha, Kevin ; Dunne, Greg.
Materials Science Forum. 600-603 (2008) - p. 775-778 , 2008

Link: https://doi.org/10.4028/..

12

Avalanche Multiplication and Impact Ionisation in Separate ..:

Loh, W.S. ; David, John P.R. ; Soloviev, Stanislav I....
Materials Science Forum. 600-603 (2008) - p. 1207-1210 , 2008

Link: https://doi.org/10.4028/..

13

Progress in Cold-Wall Epitaxy for 4H-SiC High-Power Devices:

Rowland, L.B. ; Dunne, Greg ; Fronheiser, Jody.
Materials Science Forum. 556-557 (2007) - p. 141-144 , 2007

Link: https://doi.org/10.4028/..

14

An X-Ray Topographic Analysis of the Crystal Quality of Glo..:

Brazil, I. ; McNally, Patrick J. ; Ren, N....
Materials Science Forum. 556-557 (2007) - p. 227-230 , 2007

Link: https://doi.org/10.4028/..

15

Determination of Impact Ionization Coefficients Measured fr..:

Loh, W.S. ; Johnson, C. Mark ; Ng, J.S....
Materials Science Forum. 556-557 (2007) - p. 339-342 , 2007

Link: https://doi.org/10.4028/..