Soo, Wen-Ni
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9

EELS Plasmon Technique for invisible Si Residual Defect Ana..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Soo, Chi Wen ; Tee, Irene ; Zhu, Jie - p. 1-5 , 2023
 
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Multiresponse spline regression:

Soo, Yuh-Wen ; Bates, Douglas M.
Computational Statistics & Data Analysis.  22 (1996)  6 - p. 619-631 , 1996
 
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Loosely coupled nonlinear least squares:

Soo, Yuh-Wen ; Bates, Douglas M.
Computational Statistics & Data Analysis.  14 (1992)  2 - p. 249-259 , 1992
 
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