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Spagnuolo, Giuseppe Schirripa
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1

An experimental setup for the study of Plasmopara viticola ..:

, In: 2023 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor),
Greco, Manuel ; Leccisi, Mariagrazia ; Spagnuolo, Giuseppe Schirripa. - p. 512-515 , 2023
Link: https://doi.org/10.1109/..
 
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2

Design of Wireless Optical System for Data Transmission ins..:

, In: 2024 11th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Leccese, Fabio ; Spagnolo, Giuseppe Schirripa - p. 443-448 , 2024
Link: https://doi.org/10.1109/..
 
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3

Local Correlation Degree of Laser Speckle for Vibration Ana..:

, In: 2023 IEEE 10th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Spagnolo, Giuseppe Schirripa ; Leccese, Fabio - p. 655-660 , 2023
Link: https://doi.org/10.1109/..
 
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4

Medical Imaging: Artificial Intelligence (AI) and Decision ..:

, In: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE),
Spagnolo, Giuseppe Schirripa ; Leccese, Fabio - p. 110-115 , 2022
Link: https://doi.org/10.1109/..
 
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5

Simple and Economical Shearography System for Testing of Ae..:

, In: 2022 IEEE 9th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Spagnolo, Giuseppe Schirripa ; Leccisi, Mariagrazia ; Leccese, Fabio - p. 571-576 , 2022
Link: https://doi.org/10.1109/..
 
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6

Inertial Navigation Systems (INS) for Drones: Position Erro..:

, In: 2020 IEEE 7th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Petritoli, Enrico ; Leccese, Fabio ; Spagnolo, Giuseppe Schirripa - p. 500-504 , 2020
Link: https://doi.org/10.1109/..
 
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7

In-Line Quality Control in Semiconductors Production and Av..:

, In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT,
Petritoli, Enrico ; Leccese, Fabio ; Spagnolo, Giuseppe Schirripa - p. 665-668 , 2020
Link: https://doi.org/10.1109/..
 
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8

Optical Wireless Communication and Li-Fi: a New Infrastruct..:

, In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT,
Spagnolo, Giuseppe Schirripa ; Cozzella, Lorenzo ; Leccese, Fabio... - p. 674-678 , 2020
Link: https://doi.org/10.1109/..
 
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9

A New Approach to define reproducibility of Additive Layers..:

, In: 2020 IEEE 7th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Giarnetti, Sabino ; De Francesco, Eduardo ; De Francesco, Ruggero... - p. 529-533 , 2020
Link: https://doi.org/10.1109/..
 
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10

Electronic Nose for Pesticides: The First Study Towards a S..:

Leccese, Fabio ; Cagnetti, Marco ; Giarnetti, Sabino...
Contemporary Agriculture.  68 (2019)  1-2 - p. 17-22 , 2019
Link: https://doi.org/10.2478/..
 
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11

Probe Position Error Compensation in Near-field to Far-fiel..:

, In: 2019 IEEE 5th International Workshop on Metrology for AeroSpace (MetroAeroSpace),
Petritoli, Enrico ; Leccese, Fabio ; Ciani, Lorenzo. - p. 214-217 , 2019
Link: https://doi.org/10.1109/..
 
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12

Solar-Electric Boat:

Spagnolo, Giuseppe Schirripa ; Papalillo, Donato ; Martocchia, Andrea.
Journal of Transportation Technologies.  2 (2012)  2 - p. 144-149 , 2012
Link: https://doi.org/10.4236/..
 
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13

LED Applications in Railway Signals: Wavelength and Intensi..:

Spagnolo, Giuseppe Schirripa ; Papalillo, Donato ; Martocchia, Andrea
Journal of Transportation Technologies.  2 (2012)  1 - p. 78-83 , 2012
Link: https://doi.org/10.4236/..
 
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14

Holographic watermarking for authentication of cut images:

Spagnolo, Giuseppe Schirripa ; De Santis, Michele
Optics and Lasers in Engineering.  49 (2011)  12 - p. 1447-1455 , 2011
Link: https://doi.org/10.1016/..
 
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15

Determination of the chronological sequence of heterogeneou..:

Spagnolo, Giuseppe Schirripa
Measurement Science and Technology.  18 (2007)  3 - p. 609-614 , 2007
Link: https://doi.org/10.1088/..
 
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