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2024 IEEE International Reliability Physics Symposium (IRPS) ,
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Side and Corner Region Non-Uniformities in Grown SiO2 and T..:
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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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On The Contribution of Secondary Holes in Hot-Carrier Degra..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Environmental Impact of CMOS Logic Technologies:
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2022 International Electron Devices Meeting (IEDM) ,
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FinFETs with Thermally Stable RMG Gate Stack for Future DRA..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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High Performance Thermally Resistant FinFETs DRAM Periphera..:
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2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
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TCAD-Assisted MultiPhysics Modeling & Simulation for Accele..:
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2020 IEEE Symposium on VLSI Technology ,
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Buried power SRAM DTCO and system-level benchmarking in N3:
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2020 IEEE Symposium on VLSI Technology ,
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First Monolithic Integration of 3D Complementary FET (CFET)..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
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Fast & Accurate Methodology for Aging Incorporation in Circ..:
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2020 IEEE International Electron Devices Meeting (IEDM) ,
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DTCO including Sustainability: Power-Performance-Area-Cost-..:
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2019 IEEE International Integrated Reliability Workshop (IIRW) ,
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Reliability Engineering Enabling Continued Logic for Memory..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
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Novel forksheet device architecture as ultimate logic scali..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
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Multiphysics Simulation & Design of Silicon Quantum Dot Qub..:
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2019 IEEE International Integrated Reliability Workshop (IIRW) ,
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