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1
Testinstrumente und Testdatenanalyse zur Verarbeitung von U..
von Alexander Sprenger ; Erster Gutachter: Prof. Dr. Sybill...
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2020 IEEE International Test Conference (ITC) ,
2
Logic Fault Diagnosis of Hidden Delay Defects:
, In:
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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
3
Variation-Aware Test for Logic Interconnects using Neural N..:
, In:
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2019 IEEE International Test Conference (ITC) ,
4