Sreedhar, Aswin
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1

Nanoscale CMOS VLSI circuits 

design for manufacturability 
Copies:  Zentrale:E02 a elt 697 e/261
 
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2

TURBONFS : turbo nand flash search:

, In: Proceedings of the 20th symposium on Great lakes symposium on VLSI,
Vyas, Shruti ; Sreedhar, Aswin ; Kundu, Sandip - p. 251-256 , 2010
 
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3

On linewidth-based yield analysis for nanometer lithography:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Sreedhar, Aswin ; Kundu, Sandip - p. 381-386 , 2009
 
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4

On modeling and testing of lithography related open faults ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
 
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5

Managing Lithographic Variations in Design, Reliability, an..:

Sreedhar, Aswin
https://scholarworks.umass.edu/open_access_dissertations/358.  , 2011
 
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7

Analysis of hesitancy and motivational factors for COVID-19..:

Kirandeep Kaur ; O Annamalai ; Bharat Gurnani...
http://www.ijo.in/article.asp?issn=0301-4738;year=2022;volume=70;issue=10;spage=3650;epage=3657;aulast=Kaur.  , 2022
 
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