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Sriboonlue, Varin
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1

Comprehensive Socket Characterization and Correlation for H..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Sriboonlue, Varin ; Jeon, Yeseul ; Luevano, Gerardo R... - p. 1768-1772 , 2024
Link: https://doi.org/10.1109/..
 
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2

Comprehensive PDN/PSIJ analysis of silicon capacitor use fo..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Powers, Scott ; Casanova, Jonathan ; Kundu, Arun... - p. 980-984 , 2023
Link: https://doi.org/10.1109/..
 
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3

Copper Roughness Induced Gain for Inductance and Resistance..:

, In: 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
Luevano, Gerardo Romo ; Michalka, Tim ; Sonawane, Vinit. - p. 392-396 , 2022
Link: https://doi.org/10.1109/..
 
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4

Broadband Characterization of Copper Roughness by Comparing..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),
Luevano, Gerardo Romo ; Michalka, Tim ; Sriboonlue, Varin - p. 108-112 , 2020
Link: https://doi.org/10.1109/..
 
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5

Accurate Socket Modeling And Validation For SI/PI Applicati..:

, In: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI),
Wang, Tao ; Sriboonlue, Varin ; Ozbayat, Selman... - p. 135-140 , 2019
Link: https://doi.org/10.1109/..
 
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