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Steigmeier, E. F.
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1

Light emission from a silicon quantum well:

Steigmeier, E. F. ; Morf, R. ; Grützmacher, D....
Applied Physics Letters.  69 (1996)  27 - p. 4165-4167 , 1996
Link: https://doi.org/10.1063/..
 
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2

Size dependence of band gaps in silicon nanostructures:

Delley, B. ; Steigmeier, E. F.
Applied Physics Letters.  67 (1995)  16 - p. 2370-2372 , 1995
Link: https://doi.org/10.1063/..
 
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3

Light emission from recrystallized amorphous Si MQW structu..:

Steigmeier, E.F. ; Grützmacher, D. ; Auderset, H....
Thin Solid Films.  255 (1995)  1-2 - p. 295-297 , 1995
Link: https://doi.org/10.1016/..
 
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4

Visible light emission from Si materials:

Steigmeier, E.F. ; Auderset, H. ; Delley, B..
Journal of Luminescence.  57 (1993)  1-6 - p. 9-12 , 1993
Link: https://doi.org/10.1016/..
 
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5

Oxygen isotope exchange kinetics and site-selective oxygen ..:

Conder, K. ; Kaldis, E. ; Maciejewski, M...
Physica C: Superconductivity.  210 (1993)  1-2 - p. 282-288 , 1993
Link: https://doi.org/10.1016/..
 
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6

Light-emitting devices in industrial CMOS technology:

Kramer, J. ; Seitz, P. ; Steigmeier, E.F....
Sensors and Actuators A: Physical.  37-38 (1993)  - p. 527-533 , 1993
Link: https://doi.org/10.1016/..
 
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7

Light scattering topography and photoluminescence topograph:

Steigmeier, E. F. ; Auderset, H.
Applied Physics A Solids and Surfaces.  50 (1990)  6 - p. 531-540 , 1990
Link: https://doi.org/10.1007/..
 
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8

Nondestructive assessment of SIMOX substrates:

Steigmeier, E.F. ; Harbeke, G. ; Reeson, K.J...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  37-38 (1989)  - p. 304-307 , 1989
Link: https://doi.org/10.1016/..
 
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9

Resonance Raman scattering on poly(3-methylthiophene):

Steigmeier, E.F ; Auderset, H ; Kobel, W.
Synthetic Metals.  18 (1987)  1-3 - p. 219-224 , 1987
Link: https://doi.org/10.1016/..
 
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10

Monitoring of SIMOX layer properties and implantation tempe..:

Harbeke, G ; Steigmeier, E F ; Hemment, P..
Semiconductor Science and Technology.  2 (1987)  10 - p. 687-690 , 1987
Link: https://doi.org/10.1088/..
 
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11

Growth and Physical Properties of LPCVD Polycrystalline SiO..:

Widmer, A. E. ; Harbeke, G. ; Krausbauer, L..
Journal of The Electrochemical Society.  133 (1986)  9 - p. 1880-1886 , 1986
Link: https://doi.org/10.1149/..
 
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12

Raman scattering on MEM(TCNQ)2 in the vicinity of the spin-..:

Steigmeier, E.F. ; Auderset, H. ; Baeriswyl, D..
Physica B+C.  143 (1986)  1-3 - p. 556-558 , 1986
Link: https://doi.org/10.1016/..
 
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13

Raman Effect and Infrared Reflectivity in MNEB (TCNQ)2 and ..:

Steigmeier, E. F. ; Auderset, H. ; Baeriswyl, D..
Molecular Crystals and Liquid Crystals.  120 (1985)  1 - p. 163-166 , 1985
Link: https://doi.org/10.1080/..
 
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14

Growth and Physical Properties of LPCVD Polycrystalline Sil..:

Harbeke, G. ; Krausbauer, L. ; Steigmeier, E. F....
Journal of The Electrochemical Society.  131 (1984)  3 - p. 675-682 , 1984
Link: https://doi.org/10.1149/..
 
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15

Structural Perfection Testing of Films and Wafers by Means ..:

Steigmeier, E. F. ; Auderset, H.
Journal of The Electrochemical Society.  131 (1984)  7 - p. 1693-1699 , 1984
Link: https://doi.org/10.1149/..
 
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