Strüder, L.
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1

PNDetector – Global Supplier of Modern Radiation Detectors ..:

Niculae, A ; Aschauer, S ; Schmid, M...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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2

An Advanced Smart Counting Mode for Pixelated Direct Electr..:

Eckert, B ; Aschauer, S ; Huth, M...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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3

How to Count Electrons with Pixelated Semiconductor Detecto..:

Eckert, B ; Aschauer, S ; Huth, M...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 705-706 , 2023
 
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4

Qualification of the X-ray spectral performance of the DEPF..:

Castoldi, A. ; Ghisetti, M. ; Guazzoni, C....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1057 (2023)  - p. 168686 , 2023
 
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5

Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:

Huth, M ; Eckert, B ; Aschauer, S...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 401-402 , 2023
 
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6

Latest Improvements on Silicon Drift Detectors for Fast, Hi..:

Niculae, A ; Aschauer, S ; Bornschlegl, M...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 2087-2088 , 2023
 
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7

Electron Image Reconstruction for Pixelated Semiconductor T..:

Eckert, B ; Aschauer, S ; Hedley, E...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 3040-3042 , 2022
 
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8

Calibration of the Non-linear Response of the First Ladder ..:

, In: 2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),
Castoldi, A. ; Ghisetti, M. ; Aschauer, S.... - p. 1-3 , 2022
 
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9

Energy-dispersive X-ray micro Laue diffraction on a bent go..:

AlHassan, Ali ; Abboud, A. ; Cornelius, T. W....
Journal of Applied Crystallography.  54 (2021)  1 - p. 80-86 , 2021
 
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10

Screening for irradiation vasculopathy by intima-media thic..:

Strüder, D. ; Hellwig, S. ; Rennau, H....
European Archives of Oto-Rhino-Laryngology.  278 (2020)  6 - p. 2017-2026 , 2020
 
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11

EDLD-Tool: A real-time GPU-based tool to stream and analyze..:

Tosson, A. ; Shokr, M. ; Abboud, A....
Journal of Instrumentation.  14 (2019)  1 - p. P01008-P01008 , 2019
 
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12

Qualification and Integration Aspects of the DSSC Mega-Pixe..:

Hansen, K. ; Klar, H. ; Kalavakuru, P....
IEEE Transactions on Nuclear Science.  66 (2019)  8 - p. 1966-1975 , 2019
 
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13

Silicon Drift Detectors in Electron Microscopy - An Over 20..:

Liebel, A. ; Schöning, A. ; Bechteler, A....
Microscopy and Microanalysis.  24 (2018)  S1 - p. 796-797 , 2018
 
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