Strane, J.
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1

Manufacturing Yield Improvement for Advanced CMOS Technolog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Fan, S.-C. ; Jamison, P. ; Pancharatnam, S.... - p. 1-3 , 2023
 
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2

Hardware Based Performance Assessment of Vertical-Transport..:

, In: 2022 International Electron Devices Meeting (IEDM),
Tsutsui, G. ; Song, S. ; Strane, J.... - p. 34.4.1-34.4.4 , 2022
 
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3

Vertical-Transport Nanosheet Technology for CMOS Scaling be..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Jagannathan, H. ; Anderson, B. ; Sohn, C-W.... - p. 26.1.1-26.1.4 , 2021
 
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4

Middle of Line (MOL) Process Investigation in Ring Oscillat..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Chan, Victor ; Bergendahl, M. ; Choi, S.... - p. 1-4 , 2020
 
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5

Quantitative Electron Energy Loss Spectroscopy (EELS) Analy..:

Li, J. ; Bruley, J. ; Conti, R....
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1462-1463 , 2017
 
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6

Optical Characterization of Si1-xCx/Si ( 0≤x≤0.014) Semicon..:

Lee, Hosun ; Kurtz, S. R. ; Floro, J. A....
Japanese Journal of Applied Physics.  34 (1995)  10B - p. L1340 , 1995
 
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7

Electron irradiation damage in oxides:

Buckett, M.I. ; Strane, J. ; Luzzi, D.E....
Ultramicroscopy.  29 (1989)  1-4 - p. 217-227 , 1989
 
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9

Receipt and duration of buprenorphine treatment during preg..:

Wang, Xi ; Meisel, Zachary ; Kellom, Katherine...
Drug and Alcohol Dependence Reports.  9 (2023)  - p. 100206 , 2023
 
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11

Housing and asthma disparities:

Bryant-Stephens, Tyra C. ; Strane, Douglas ; Robinson, Elizabeth K...
Journal of Allergy and Clinical Immunology.  148 (2021)  5 - p. 1121-1129 , 2021
 
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14

Phage-based molecular probes that discriminate force-induce..:

Cao, Lizhi ; Zeller, Mark K. ; Fiore, Vince F....
Proceedings of the National Academy of Sciences.  109 (2012)  19 - p. 7251-7256 , 2012
 
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15

Phage-based molecular probes that discriminate force-induce..:

Cao, Lizhi ; Zeller, Mark K. ; Fiore, Vince F....
Proceedings of the National Academy of Sciences of the United States of America.  109 (2012)  19 - p. 7251-7256 , 2012
 
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