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2
System-on-chip test architectures
nanometer design for testability
The Morgan Kaufmann series in systems on silicon
Copies:
Zentrale:E02 a inf 170 ef/741
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5
System-on-chip test architectures: nanometer design for tes..
The Morgan Kaufmann series in systems on silicon
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Proceedings of the 1995 Asia and South Pacific Design Automation Conference ,
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