Sugawa, Shigetoshi
220  results:
Search for persons X
?
1

Threshold voltage uniformity improvement by introducing cha..:

Goto, Tetsuya ; Suwa, Tomoyuki ; Katayama, Keita...
Japanese Journal of Applied Physics.  63 (2024)  2 - p. 02SP51 , 2024
 
?
2

[Invited Paper] A High SNR Global Shutter CMOS Image Sensor..:

Oikawa, Tetsu ; Kuroda, Rihito ; Hamaya, Aoi...
ITE Transactions on Media Technology and Applications.  12 (2024)  2 - p. 167-174 , 2024
 
?
 
?
5

[Paper] High-Resolution Defect Detection for Flat Panel Dis..:

Yasuda, Toshiro ; Sugawa, Shigetoshi ; Kuroda, Rihito...
ITE Transactions on Media Technology and Applications.  11 (2023)  4 - p. 158-163 , 2023
 
?
7

Visualization and Analysis of Temporal and Steady-State Gas..:

Sakai, Yushi ; Shiba, Yoshinobu ; Inada, Takafumi...
IEEE Transactions on Semiconductor Manufacturing.  36 (2023)  4 - p. 515-519 , 2023
 
?
9

A 70-dB SNR High-Speed Global Shutter CMOS Image Sensor for..:

Oikawa, Tetsu ; Kuroda, Rihito ; Takahashi, Keigo...
IEEE Transactions on Electron Devices.  69 (2022)  6 - p. 2965-2972 , 2022
 
?
11

34.3: High Resolution and High Speed Inspection Equipment f..:

Yasuda, Toshiro ; Kobayashi, Kazuhisa ; Yamamoto, Yuichi...
SID Symposium Digest of Technical Papers.  53 (2022)  S1 - p. 363-366 , 2022
 
?
12

In Situ Measurement and Analysis of Low Pressure Gas Concen..:

, In: 2022 International Symposium on Semiconductor Manufacturing (ISSM),
 
?
14

A high-precision current measurement platform applied for s..:

Saito, Koga ; Suzuki, Hayato ; Park, Hyeonwoo...
Japanese Journal of Applied Physics.  60 (2021)  8 - p. 086501 , 2021
 
?
15

An Over 120 dB Single Exposure Wide Dynamic Range CMOS Imag..:

Fujihara, Yasuyuki ; Murata, Maasa ; Nakayama, Shota..
IEEE Transactions on Electron Devices.  68 (2021)  1 - p. 152-157 , 2021
 
1-15