Suligoj, Tomislav
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3

Performance of the MALTA telescope:

van Rijnbach, Milou ; Gustavino, Giuliano ; Allport, Phil...
The European Physical Journal C.  83 (2023)  7 - p. , 2023
 
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4

The Effect of Collector Region Design on Large-Signal Perfo..:

Bogdanović, Filip ; Osrečki, Željko ; Žilak, Josip..
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3424-3429 , 2023
 
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5

Optimization of GaN HEMTs with ScAlN Barrier for High 2DEG ..:

, In: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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6

Mobility Limitations in Single- and Double-Heterostructure ..:

Berdalovic, Ivan ; Poljak, Mirko ; Suligoj, Tomislav
IEEE Transactions on Electron Devices.  70 (2023)  11 - p. 5577-5583 , 2023
 
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8

Theoretical Prediction of Mobility Improvement in GaN-Based..:

Berdalovic, Ivan ; Poljak, Mirko ; Suligoj, Tomislav
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1425-1429 , 2023
 
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9

Recent results with radiation-tolerant TowerJazz 180 nm MAL..:

LeBlanc, Matt ; Allport, Phil ; Asensi, Igancio...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1041 (2022)  - p. 167390 , 2022
 
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10

MALTA3: Concepts for a new radiation tolerant sensor in the..:

Dobrijević, Dominik ; Allport, Phil ; Asensi, Ignacio...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1040 (2022)  - p. 167226 , 2022
 
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11

Investigation of the Electrical Performance of Voltage-Cont..:

, In: 2022 International Conference on Smart Systems and Technologies (SST),
 
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12

Numerical Optimization of On-Resistance and Transconductanc..:

, In: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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13

Low-Temperature Electrical Performance of PureB Photodiodes..:

Knezevic, Tihomir ; Suligoj, Tomislav ; Capan, Ivana.
IEEE Transactions on Electron Devices.  68 (2021)  6 - p. 2810-2817 , 2021
 
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15

On the modelling of interface roughness scattering in AlGaN..:

, In: 2020 43rd International Convention on Information, Communication and Electronic Technology (MIPRO),
 
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