Sun, Rong-En
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1

Legal issues of space colonization:

, In: Zeitschrift für Luft- und Weltraumrecht / Institut für Luft- und Weltraumrecht der Universität zu Köln
Sun, Rong-En. (2017)  3 - p. 476-490
Copies:  Juridicum: z jur 071/620; Juridicum: z jur 071/620
 
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2

Analysis of streak defects on the surface of high-quality a..:

Li, Yan ; Wang, Ke-qiang ; Xia, Lei...
Journal of Physics: Conference Series.  2454 (2023)  1 - p. 012019 , 2023
 
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3

Analysis of the mechanism of chromatic aberration defects o..:

Li, Yan ; Xia, Lei ; Liu, Ren-dong...
Journal of Physics: Conference Series.  2348 (2022)  1 - p. 012007 , 2022
 
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4

A Note on Adjacent Strong Edge Coloring of K(n,m):

Li, Jing-wen ; Zhang, Zhong-fu ; Chen, Xiang-en.
Acta Mathematicae Applicatae Sinica, English Series.  22 (2006)  2 - p. 273-276 , 2006
 
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5

Lineshape variations of two-photon transitions based on qua..:

Wang, Wei-Sheng ; Deng, Le ; Sun, Zhen-Rong..
Journal of Physics B: Atomic, Molecular and Optical Physics.  33 (2000)  11 - p. 2117-2123 , 2000
 
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7

Author Correction: Cis-stilbene glucoside in Polygonum mult..:

Meng, Ya-kun ; Li, Chun-yu ; Li, Rui-yu...
Acta Pharmacologica Sinica.  42 (2020)  10 - p. 1723-1724 , 2020
 
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8

Effects of Different Counter Anions on Solid-State Electron..:

Sui, Qi ; Li, Peng ; Sun, Rong...
The Journal of Physical Chemistry Letters.  11 (2020)  21 - p. 9282-9288 , 2020
 
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9

Cis-stilbene glucoside in Polygonum multiflorum induces imm..:

Meng, Ya-kun ; Li, Chun-yu ; Li, Rui-yu...
Acta Pharmacologica Sinica.  38 (2017)  10 - p. 1340-1352 , 2017
 
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10

Nearly Ideal Subthreshold Swing and Delay Reduction of Stac..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Tsai, Chung-En ; Cheng, Chun-Yi ; Huang, Bo-Wei... - p. 401-402 , 2022
 
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11

Highly Stacked GeSn Nanosheets by CVD Epitaxy and Highly Se..:

Huang, Bo-Wei ; Tsai, Chung-En ; Liu, Yi-Chun...
IEEE Transactions on Electron Devices.  69 (2022)  4 - p. 2130-2136 , 2022
 
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12

Highly Stacked 8 $\mathbf{Ge}_{\boldsymbol{0.9}}\mathbf{Sn}..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Tsai, Chung-En ; Liu, Yi-Chun ; Tu, Chien-Te... - p. 26.4.1-26.4.4 , 2021
 
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