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TARDIF, S.
707
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1
Electrical activation of insulator-to-metal transition in v..:
Orlianges, J.-C.
;
Allegret, O.
;
Sirjita, E.-N.
...
Journal of Applied Physics. 136 (2024) 6 - p. , 2024
Link:
https://doi.org/10.1063/..
?
2
Impact of the growth strategy and device fabrication on the..:
Segura-Ruiz, Jaime
;
Pauc, N.
;
Chrétien, J.
...
Materials Science and Engineering: B. 264 (2021) - p. 114899 , 2021
Link:
https://doi.org/10.1016/..
?
3
Transfer of an ultrathin single-crystal silicon film from a..:
Michaud, L.G.
;
Azrak, E.
;
Castan, C.
...
Materials Today Nano. 13 (2021) - p. 100107 , 2021
Link:
https://doi.org/10.1016/..
?
4
Linking bioavailability and toxicity changes of complex che..:
Cipullo, S.
;
Negrin, I.
;
Claveau, L.
...
Science of The Total Environment. 650 (2019) - p. 2150-2163 , 2019
Link:
https://doi.org/10.1016/..
?
5
Insights into mixed contaminants interactions and its impli..:
Cipullo, S.
;
Snapir, B.
;
Tardif, S.
...
Science of The Total Environment. 645 (2018) - p. 662-673 , 2018
Link:
https://doi.org/10.1016/..
?
6
Crack Front Interaction with Self-Emitted Acoustic Waves:
Massy, D.
;
Mazen, F.
;
Landru, D.
...
Physical Review Letters. 121 (2018) 19 - p. , 2018
Link:
https://doi.org/10.1103/..
?
7
Germanium based photonic components toward a full silicon/g..:
Reboud, V.
;
Gassenq, A.
;
Hartmann, J.M.
...
Progress in Crystal Growth and Characterization of Materials. 63 (2017) 2 - p. 1-24 , 2017
Link:
https://doi.org/10.1016/..
?
8
X-Ray Reflectivity Analysis of SiO2 Nanochannels Filled wit..:
Baum, M.
;
Rébiscoul, D.
;
Tardif, S.
...
Procedia Earth and Planetary Science. 17 (2017) - p. 682-685 , 2017
Link:
https://doi.org/10.1016/..
?
9
Raman-strain relations in highly strained Ge: Uniaxial ⟨100..:
Gassenq, A.
;
Tardif, S.
;
Guilloy, K.
...
Journal of Applied Physics. 121 (2017) 5 - p. , 2017
Link:
https://doi.org/10.1063/..
?
10
Gamma bandgap determination in pseudomorphic GeSn layers gr..:
Gassenq, A.
;
Milord, L.
;
Aubin, J.
...
Applied Physics Letters. 109 (2016) 24 - p. , 2016
Link:
https://doi.org/10.1063/..
?
11
Interface water diffusion in silicon direct bonding:
Tedjini, M.
;
Fournel, F.
;
Moriceau, H.
...
Applied Physics Letters. 109 (2016) 11 - p. , 2016
Link:
https://doi.org/10.1063/..
?
12
Study of the light emission in Ge layers and strained membr..:
Gassenq, A.
;
Guilloy, K.
;
Pauc, N.
...
Thin Solid Films. 613 (2016) - p. 64-67 , 2016
Link:
https://doi.org/10.1016/..
?
13
Accurate strain measurements in highly strained Ge microbri..:
Gassenq, A.
;
Tardif, S.
;
Guilloy, K.
...
Applied Physics Letters. 108 (2016) 24 - p. , 2016
Link:
https://doi.org/10.1063/..
?
14
Fracture dynamics in implanted silicon:
Massy, D.
;
Mazen, F.
;
Tardif, S.
...
Applied Physics Letters. 107 (2015) 9 - p. , 2015
Link:
https://doi.org/10.1063/..
?
15
1.9% bi-axial tensile strain in thick germanium suspended m..:
Gassenq, A.
;
Guilloy, K.
;
Osvaldo Dias, G.
...
Applied Physics Letters. 107 (2015) 19 - p. , 2015
Link:
https://doi.org/10.1063/..
1-15