E-LIB Suche - Ergebnisse für: Tadakuma, Toshiya

1

ESD Tolerance Improvement of Power Module using Clamp Diode..:

, In: 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference & Compatibility (APEMC/INCEMIC),

Tadakuma, Toshiya ; Rogers, Michael ; Sah, Priyesh... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

2

Simple Radiated Noise Estimation Based on Datasets of SiC a..:

, In: 2023 IEEE Applied Power Electronics Conference and Exposition (APEC),

Tadakuma, Toshiya ; Rogers, Michael ; Joko, Motonobu - p. 64-68 , 2023

Link: https://doi.org/10.1109/..

3

Device Design Direction of CSTBT for Low Loss and EMI Noise:

Nishi, Koichi ; Konishi, Kazuya ; Tadakuma, Toshiya..
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6144-6150 , 2023

Link: https://doi.org/10.1109/..

4

Radiated Noise Direct Quantification on SiC MOSFET Half-Bri..:

, In: 2022 IEEE Applied Power Electronics Conference and Exposition (APEC),

Tadakuma, Toshiya ; Matsutaka, Yuki ; Rogers, Michael. - p. 923-927 , 2022

Link: https://doi.org/10.1109/..

5

Dominant Timing Direct Identification for Radiation Noise d..:

, In: 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI),

Tadakuma, Toshiya ; Nishi, Koichi ; Rogers, Michael. - p. 73-78 , 2020

Link: https://doi.org/10.1109/..

6

Empirical Radiation Noise Identification and Reduction by O..:

, In: 2020 IEEE Applied Power Electronics Conference and Exposition (APEC),

Tadakuma, Toshiya ; Shibata, Shogo ; Rogers, Michael. - p. 2732-2735 , 2020

Link: https://doi.org/10.1109/..

7

Diagnostic Accuracy of Point-of-Care Gram Stains in Obstruc..:

Hayano, Satoshi ; Hidaka, Toshiya ; Tadakuma, Risako.
Open Forum Infectious Diseases. 11 (2024) 3 - p. , 2024

Link: https://doi.org/10.1093/..