Search for persons
X
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Microscopic Modeling of MgO Barrier Degradation Due to Inte..:
, In:
?
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
2
Ultra-High Endurance (>1012) and High Drive-Current Selecto..:
, In:
?
2023 International Electron Devices Meeting (IEDM) ,
3