Tan, Benjamin
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2

(Security) Assertions by Large Language Models:

Kande, Rahul ; Pearce, Hammond ; Tan, Benjamin...
IEEE Transactions on Information Forensics and Security.  19 (2024)  - p. 4374-4389 , 2024
 
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3

Using Static Analysis for Enhancing HLS Security:

Collini, Luca ; Ah-Kiow, Joey ; Pilato, Christian..
IEEE Embedded Systems Letters.  16 (2024)  2 - p. 166-169 , 2024
 
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4

VeriGen: A Large Language Model for Verilog Code Generation:

Thakur, Shailja ; Ahmad, Baleegh ; Pearce, Hammond...
ACM Transactions on Design Automation of Electronic Systems.  29 (2024)  3 - p. 1-31 , 2024
 
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5

Durvalumab or placebo plus gemcitabine and cisplatin in par..:

Oh, Do-Youn ; He, Aiwu Ruth ; Bouattour, Mohamed...
The Lancet Gastroenterology & Hepatology.  9 (2024)  8 - p. 694-704 , 2024
 
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6

Scaling Attacks on Large Logic-Locked Designs:

Moosa, Abdul Khader Thalakkattu ; Tan, Benjamin ; Karri, Ramesh
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
 
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7

Sonothrombolysis for Ischemic Stroke:

Venketasubramanian, Narayanaswamy ; Yeo, Leonard L. L. ; Tan, Benjamin.
Journal of Cardiovascular Development and Disease.  11 (2024)  3 - p. 75 , 2024
 
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9

On Hardware Security Bug Code Fixes by Prompting Large Lang..:

Ahmad, Baleegh ; Thakur, Shailja ; Tan, Benjamin..
IEEE Transactions on Information Forensics and Security.  19 (2024)  - p. 4043-4057 , 2024
 
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10

Manipulation Attacks on Learned Image Compression:

Liu, Kang ; Wu, Di ; Wu, Yangyu...
IEEE Transactions on Artificial Intelligence.  5 (2024)  6 - p. 3083-3097 , 2024
 
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12

Theoretical Patchability Quantification for IP-Level Hardwa..:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
Liu, Wei-Kai ; Tan, Benjamin ; Fung, Jason M.. - p. 951-956 , 2024
 
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13

ALMOST: Adversarial Learning to Mitigate Oracle-less ML Att..:

, In: 2023 60th ACM/IEEE Design Automation Conference (DAC),
 
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14

Bulls-Eye: Active Few-Shot Learning Guided Logic Synthesis:

Basak Chowdhury, Animesh ; Tan, Benjamin ; Carey, Ryan...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  8 - p. 2580-2590 , 2023
 
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