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Tan, Cher Ming
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1

Addressing practical challenges of LiB cells in their pack ..:

Tan, Cher Ming ; Yang, Yan ; Kumar, K. Jithendra Mani..
Scientific Reports.  14 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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2

Additive-free electroless deposition on graphene/copper foi..:

Chen, Hsiao-Chien ; Shabir, Abdul ; Tu, Kun-Hua...
Journal of Environmental Chemical Engineering.  12 (2024)  1 - p. 111741 , 2024
Link: https://doi.org/10.1016/..
 
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3

Root Cause Analysis of Intermittent Digital System Reset an..:

, In: 2024 Annual Reliability and Maintainability Symposium (RAMS),
Tan, Cher Ming ; Wang, Steve ; Huang, Shawn LH... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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4

Highly adsorptive removal of heavy metal, dye, and antibiot..:

Thi Mai, Nguyen ; Van Thanh, Dang ; Hien, Trinh Ngoc...
Journal of Environmental Chemical Engineering.  12 (2024)  3 - p. 113020 , 2024
Link: https://doi.org/10.1016/..
 
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5

Realizing SnF2‐TMAB passivated lead‐free formamidinum perov..:

Mishra, Debesh Devadutta ; Rath, Pranati Kumari ; Thirugnanam, Natarajan...
Progress in Photovoltaics: Research and Applications.  32 (2024)  8 - p. 569-578 , 2024
Link: https://doi.org/10.1002/..
 
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6

Pre-Mature Reliability Degradation of 5G Network Electronic..:

, In: 2024 Annual Reliability and Maintainability Symposium (RAMS),
Tan, Cher Ming ; Wang, Steve ; Xiong, Josh MP. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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7

Permanent degradation mechanisms of high-power packaged whi..:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 101-120 , 2023
Link: https://doi.org/10.1016/..
 
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8

Comparison of blue and white packaged LED degradation:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 121-143 , 2023
Link: https://doi.org/10.1016/..
 
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9

Introduction:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 1-17 , 2023
Link: https://doi.org/10.1016/..
 
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10

Concurrent Multiband CMOS Low Noise Amplifier Design for In..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),
Phetpadriew, Peerapat ; Thangarasu, Bharatha Kumar ; Mahalingam, Nagarajan... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

Reliability tests standards for LEDs:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 157-170 , 2023
Link: https://doi.org/10.1016/..
 
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12

Packaged LEDs degradation under UV radiation effect:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 145-156 , 2023
Link: https://doi.org/10.1016/..
 
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13

Compositionally engineered vacancy-ordered double-perovskit..:

Dehingia, Anurag ; Shabir, Abdul ; Tan, Cher Ming...
Journal of Alloys and Compounds.  967 (2023)  - p. 171706 , 2023
Link: https://doi.org/10.1016/..
 
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14

General failure analysis techniques for packaged LED:

, In: Reliability and Failure Analysis of High-Power LED Packaging,
Tan, Cher Ming ; Singh, Preetpal - p. 19-48 , 2023
Link: https://doi.org/10.1016/..
 
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15

Degradation Physics of Silicone Under UV-A Irradiation:

Shabir, Abdul ; Tan, Cher Ming ; Singh, Preetpal
IEEE Transactions on Device and Materials Reliability.  23 (2023)  4 - p. 584-590 , 2023
Link: https://doi.org/10.1109/..
 
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