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Tan, Pik Kee
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1

A novel method combining laser ablation and chemical etch t..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Ting, Siong Luong ; Tan, Pik Kee ; SeungJe, Moon... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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2

Atomic Force Probing and Focus Exposure Matrix Analysis to ..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Wee, Teck Leong ; Linewih, Handoko ; Chwa, Sally... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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3

Failure analysis on capacitor failures using simple circuit..:

Ting, Siong Luong ; Tan, Pik Kee ; Thoungh, Hnin Hnin Win...
Microelectronics Reliability.  135 (2022)  - p. 114566 , 2022
Link: https://doi.org/10.1016/..
 
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4

Advanced Sample Preparation Techniques for Rescuing Damaged..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Pan, Yanlin ; Tan, Pik Kee ; Ting, Siong Luong. - p. 1-8 , 2020
Link: https://doi.org/10.1109/..
 
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5

Application of Laser Deprocessing Technique in Physical Fai..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
PAN, Yanlin ; ZHAO, Yuzhe ; TAN, Pik Kee... - p. 1-7 , 2019
Link: https://doi.org/10.1109/..
 
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6

Endpoint Detection Methods in Implementing AI-assisted Poli..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
TAN, Hao ; LEO, Jacobus ; PARAB, Shreyas M... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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7

An Improved Analysis Method on Si-Photonics Waveguide Sidew..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
TAN, Hao ; ZHU, Xintong ; ANG, Poh Chuan... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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8

Problems of and Solutions for Coating Techniques for TEM Sa..:

, In: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Pan, Yanlin ; Zhao, Yuzhe ; Tan, Pik Kee... - p. 1-5 , 2018
Link: https://doi.org/10.1109/..
 
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9

Electron radiation-induced material diffusion and nanocryst..:

Liu, Binghai ; Tahmasebi, Taiebeh ; Ong, Kenny...
Acta Materialia.  161 (2018)  - p. 221-236 , 2018
Link: https://doi.org/10.1016/..
 
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10

Si nano-particle characterization by atomic force microscop..:

, In: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tan, Hao ; Zhu, Jie ; Zhao, Yu Zhe... - p. 1-4 , 2017
Link: https://doi.org/10.1109/..
 
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11

Enhancement of Raman signals from low-k dielectrics with an..:

Huang, Maggie Y. M. ; Liu, Bo ; Tan, Pik Kee..
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films.  33 (2015)  2 - p. 020603 , 2015
Link: https://doi.org/10.1116/..
 
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12

Investigation on Super-Resolution Near-Field Blu-Ray-Type P..:

Shi, Luping ; Chong, Tong Chong ; Tan, Pik Kee...
Japanese Journal of Applied Physics.  44 (2005)  5S - p. 3615 , 2005
Link: https://doi.org/10.1143/..
 
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13

Multispeed rewritable optical-recording method with an init..:

Miao, Xiang Shui ; Shi, Lu Ping ; Tan, Pik Kee...
Applied Optics.  43 (2004)  5 - p. 1140 , 2004
Link: https://doi.org/10.1364/..
 
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14

Super-Resolution Near-Field Phase Change Disk with Sb70Te30..:

Shi, Luping ; Chong, Towchong ; Tan, Pik Kee...
Japanese Journal of Applied Physics.  43 (2004)  7S - p. 5001 , 2004
Link: https://doi.org/10.1143/..
 
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15

Optical Transition of Chalcogenide Phase-Change Thin Films:

Yao, H. B. ; Shi, Lu Ping ; Chong, Tow Chong..
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 2B - p. 828-831 , 2003
Link: https://doi.org/10.1143/..
 
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