Tang, Chien-Lun
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Test Methodology for Defect-Based Bridge Faults:

Chang, Shuo-Wen ; Nien, Yu-Teng ; Hu, Yu-Pang...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  30 (2022)  7 - p. 975-988 , 2022
 
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13

Test Methodology for Defect-based Bridge Faults:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
Hu, Yu-Pang ; Chang, Shuo-Wen ; Wu, Kai-Chiang... - p. 106-111 , 2020
 
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