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Tanuma, Ryohei
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1

Direct evaluation of threading dislocations in 4H-SiC throu..:

Hadorn, Jason Paul ; Tanuma, Ryohei ; Kamata, Isaho.
Philosophical Magazine.  100 (2019)  2 - p. 194-216 , 2019
Link: https://doi.org/10.1080/..
 
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2

X-ray topographical analysis of 4H-SiC epitaxial layers usi..:

Kamata, Isaho ; Tsusaka, Yoshiyuki ; Tanuma, Ryohei.
Japanese Journal of Applied Physics.  57 (2018)  9 - p. 090314 , 2018
Link: https://doi.org/10.7567/..
 
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3

(Invited) Non-Destructive Three-Dimensional Imaging of Exte..:

Tanuma, Ryohei ; Kamata, Isaho ; Tsuchida, Hidekazu
ECS Transactions.  80 (2017)  7 - p. 229-237 , 2017
Link: https://doi.org/10.1149/..
 
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4

Three-Dimensional Imaging of Extended Defects in 4H-SiC:

Tanuma, Ryohei ; Nagano, Masahiro ; Kamata, Isaho.
Materials Science Forum.  858 (2016)  - p. 361-366 , 2016
Link: https://doi.org/10.4028/..
 
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5

Three-Dimensional Imaging of Extended Defects in 4H-SiC by ..:

Tanuma, Ryohei ; Tsuchida, Hidekazu
Materials Science Forum.  821-823 (2015)  - p. 343-346 , 2015
Link: https://doi.org/10.4028/..
 
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6

Three-dimensional imaging and tilt-angle analysis of disloc..:

Tanuma, Ryohei ; Nagano, Masahiro ; Kamata, Isaho.
Applied Physics Express.  7 (2014)  12 - p. 121303 , 2014
Link: https://doi.org/10.7567/..
 
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7

Three-dimensional imaging of extended defects in 4H-SiC by ..:

Tanuma, Ryohei ; Tsuchida, Hidekazu
Applied Physics Express.  7 (2014)  2 - p. 021304 , 2014
Link: https://doi.org/10.7567/..
 
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8

Three-Dimensional Imaging of Extended Defects in 4H-SiC by ..:

Tanuma, Ryohei ; Tsuchida, Hidekazu
Materials Science Forum.  778-780 (2014)  - p. 338-341 , 2014
Link: https://doi.org/10.4028/..
 
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9

Growth and Characterization of Thick 4H-SiC Epilayers for V..:

Tsuchida, Hidekazu ; Miyazawa, Tetsuya ; Zhang, Xuan...
ECS Transactions.  50 (2013)  3 - p. 109-118 , 2013
Link: https://doi.org/10.1149/..
 
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10

X-ray Microbeam Three-Dimensional Topography Imaging and St..:

Tanuma, Ryohei ; Mori, Daisuke ; Kamata, Isaho.
Applied Physics Express.  5 (2012)  6 - p. 061301 , 2012
Link: https://doi.org/10.1143/..
 
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11

X-Ray Three-Dimensional Topography Imaging of Basal-Plane a..:

Tanuma, Ryohei ; Mori, Daisuke ; Kamata, Isaho.
Materials Science Forum.  717-720 (2012)  - p. 323-326 , 2012
Link: https://doi.org/10.4028/..
 
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12

Analyses of High Leakage Currents in Al+ Implanted 4H SiC p..:

Tsuji, Takashi ; Tawara, T. ; Tanuma, Ryohei...
Materials Science Forum.  645-648 (2010)  - p. 913-916 , 2010
Link: https://doi.org/10.4028/..
 
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13

Characterization of Screw Dislocations in a 4H-Silicon Carb..:

Tanuma, Ryohei ; Tamori, Tae ; Yonezawa, Yoshiyuki...
Materials Science Forum.  615-617 (2009)  - p. 251-254 , 2009
Link: https://doi.org/10.4028/..
 
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14

Fresnel-Zone-Plate-Magnified X-ray Topography:

Tanuma, Ryohei ; Kubo, Toshikazu
Japanese Journal of Applied Physics.  45 (2006)  6R - p. 5280 , 2006
Link: https://doi.org/10.1143/..
 
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15

Axicon-Focused Noncritically Phase-Matched Second-Harmonic ..:

Tanuma, Ryohei ; Kasai, Takeshi
Japanese Journal of Applied Physics.  28 (1989)  8R - p. 1521 , 1989
Link: https://doi.org/10.1143/..
 
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