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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Evaluation on AutoTEM5 Software For Automated TEM Sample Pr..:
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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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EELS Plasmon Technique for invisible Si Residual Defect Ana..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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TEM sample preparation for a suspended structure with deep ..:
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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Improved Methodology for Planar TEM Sample Preparation:
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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Fabrication on Pure Silicon Oxide Membrane Coated TEM Grid ..:
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2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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An Efficient and Non-destructive Grounding Method for Passi..:
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2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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