E-LIB Suche - Ergebnisse für: Ter Maten, Jan

1

Model order reduction using singularly perturbed systems:

Mohaghegh, Kasra ; Pulch, Roland ; ter Maten, Jan
Applied Numerical Mathematics. 103 (2016) - p. 72-87 , 2016

Link: https://doi.org/10.1016/..

2

Robust Shape Optimization under Uncertainties in Device Mat..:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Putek, Piotr ; ter Maten, E. Jan W. ; Günther, Michael... - p. 223-260 , 2019

Link: https://doi.org/10.1007/..

3

Test Cases for Power-MOS Devices and RF-Circuitry:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Janssen, Rick ; Gillon, Renaud ; Wieers, Aarnout... - p. 459-485 , 2019

Link: https://doi.org/10.1007/..

4

Uncertainty Quantification: Introduction and Implementation:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Pulch, Roland ; Putek, Piotr ; ter Maten, E. Jan W.. - p. 197-221 , 2019

Link: https://doi.org/10.1007/..

5

Ageing Models and Reliability Prediction:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Gillon, Renaud ; Wieers, Aarnout ; Deleu, Frederik... - p. 425-455 , 2019

Link: https://doi.org/10.1007/..

6

Estimating Failure Probabilities:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

ter Maten, E. Jan W. ; Beelen, Theo G. J. ; Di Bucchianico, Alessandro... - p. 349-379 , 2019

Link: https://doi.org/10.1007/..

7

Fast Fault Simulation for Detecting Erroneous Connections i..:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Dohmen, Jos J. ; Tasic, Bratislav ; Janssen, Rick... - p. 381-400 , 2019

Link: https://doi.org/10.1007/..

8

Validation of Simulation Results on Coupled Problems:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Janssen, Rick ; Gillon, Renaud ; Wieers, Aarnout... - p. 517-563 , 2019

Link: https://doi.org/10.1007/..

9

Nanoelectronic Coupled Problems Solutions – Highlights from..:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Tischendorf, Caren ; ter Maten, E. Jan W. ; Schoenmaker, Wim - p. 1-21 , 2019

Link: https://doi.org/10.1007/..

10

Calibration of Probability Density Function:

, In: Mathematics in Industry; Nanoelectronic Coupled Problems Solutions,

Dohmen, Jos J. ; Beelen, Theo G. J. ; Dvortsova, Oryna... - p. 401-424 , 2019

Link: https://doi.org/10.1007/..

11

Nanoelectronic Coupled Problems Solutions

The European Consortium for Mathematics in Industry, 29

ter Maten, E. Jan W ; Brachtendorf, Hans-Georg ; Pulch, Roland.. - 1st ed. 2019 . , 2019

Link: https://doi.org/10.1007/..

12

Nanoelectronic COupled Problems Solutions: uncertainty quan..:

Putek, Piotr ; Janssen, Rick ; Niehof, Jan...
Journal of Mathematics in Industry. 8 (2018) 1 - p. , 2018

Link: https://doi.org/10.1186/..

13

Nanoelectronic COupled problems solutions - nanoCOPS: model..:

ter Maten, E Jan W ; Putek, Piotr A ; Günther, Michael...
Journal of Mathematics in Industry. 7 (2016) 1 - p. , 2016

Link: https://doi.org/10.1186/..

14

Shape and topology optimization of a permanent-magnet machi..:

Putek, Piotr ; Pulch, Roland ; Bartel, Andreas...
Journal of Mathematics in Industry. 6 (2016) 1 - p. , 2016

Link: https://doi.org/10.1186/..

15

Sensitivity analysis and model order reduction for random l..:

Pulch, Roland ; ter Maten, E. Jan W. ; Augustin, Florian
Mathematics and Computers in Simulation. 111 (2015) - p. 80-95 , 2015

Link: https://doi.org/10.1016/..