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Teramoto, Akinobu
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1

Switching characteristics of MgO-based MTJ with intermediat..:

Miyazaki, Yuya ; Watanabe, Chihiro ; Tsuchimoto, Junichi...
Japanese Journal of Applied Physics.  63 (2024)  3 - p. 03SP42 , 2024
Link: https://doi.org/10.35848..
 
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2

[Paper] High-Resolution Defect Detection for Flat Panel Dis..:

Yasuda, Toshiro ; Sugawa, Shigetoshi ; Kuroda, Rihito...
ITE Transactions on Media Technology and Applications.  11 (2023)  4 - p. 158-163 , 2023
Link: https://doi.org/10.3169/..
 
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3

Evaluation of MR ratio and reliability of MTJ device having..:

Amemiya, Yoshiteru ; Tsuchimoto, Junichi ; Hosoya, Hiroyuki...
Japanese Journal of Applied Physics.  62 (2023)  SC - p. SC1036 , 2023
Link: https://doi.org/10.35848..
 
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4

Evaluation of Low-Frequency Noise in MOSFETs Used as a Key ..:

Teramoto, Akinobu
Electronics.  10 (2021)  15 - p. 1759 , 2021
Link: https://doi.org/10.3390/..
 
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5

A high-precision current measurement platform applied for s..:

Saito, Koga ; Suzuki, Hayato ; Park, Hyeonwoo...
Japanese Journal of Applied Physics.  60 (2021)  8 - p. 086501 , 2021
Link: https://doi.org/10.35848..
 
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6

Impact on the Conductance Method of the Asymmetry in the AC..:

Lin, Hsin-Jyun ; Watanabe, Hiroshi ; Teramoto, Akinobu...
ECS Journal of Solid State Science and Technology.  10 (2021)  4 - p. 043004 , 2021
Link: https://doi.org/10.1149/..
 
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7

Study on Influence of O2 Concentration in Wafer Cleaning Am..:

Suwa, Tomoyuki ; Teramoto, Akinobu ; Shirai, Yasuyuki...
ECS Transactions.  97 (2020)  3 - p. 23-29 , 2020
Link: https://doi.org/10.1149/..
 
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8

Influence of silicon wafer surface roughness on semiconduct..:

Mori, Keiichiro ; Samata, Shuichi ; Mitsugi, Noritomo...
Japanese Journal of Applied Physics.  59 (2020)  SM - p. SMMB06 , 2020
Link: https://doi.org/10.35848..
 
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9

High reliability CoFeB/MgO/CoFeB magnetic tunnel junction f..:

Park, Hyeonwoo ; Teramoto, Akinobu ; Tsuchimoto, Jun-ichi...
Japanese Journal of Applied Physics.  59 (2020)  SG - p. SGGB05 , 2020
Link: https://doi.org/10.35848..
 
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10

A high-precision 1 Ω–10 MΩ range resistance measurement pla..:

Maeda, Takeru ; Omura, Yuya ; Kuroda, Rihito...
Japanese Journal of Applied Physics.  59 (2020)  SG - p. SGGL03 , 2020
Link: https://doi.org/10.35848..
 
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11

SiNx Deposition at Low Temperature Using UV-Irradiated NH3:

Shiba, Yoshinobu ; Teramoto, Akinobu ; Suwa, Tomoyuki...
ECS Transactions.  89 (2019)  4 - p. 31-36 , 2019
Link: https://doi.org/10.1149/..
 
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12

Impact of CoFeB surface roughness on reliability of MgO fil..:

Park, Hyeonwoo ; Teramoto, Akinobu ; Tsuchimoto, Jun-Ichi...
Japanese Journal of Applied Physics.  58 (2019)  SI - p. SIIB29 , 2019
Link: https://doi.org/10.7567/..
 
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13

Low-Temperature Deposition of Silicon Nitride Films Using U..:

Shiba, Yoshinobu ; Teramoto, Akinobu ; Suwa, Tomoyuki...
ECS Journal of Solid State Science and Technology.  8 (2019)  11 - p. P715-P718 , 2019
Link: https://doi.org/10.1149/..
 
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14

[Papers] Statistical Analyses of Random Telegraph Noise in ..:

Ichino, Shinya ; Mawaki, Takezo ; Teramoto, Akinobu...
ITE Transactions on Media Technology and Applications.  6 (2018)  3 - p. 163-170 , 2018
Link: https://doi.org/10.3169/..
 
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15

Experimental investigation of localized stress-induced leak..:

Park, Hyeonwoo ; Teramoto, Akinobu ; Kuroda, Rihito..
Japanese Journal of Applied Physics.  57 (2018)  4S - p. 04FE11 , 2018
Link: https://doi.org/10.7567/..
 
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