Teyssedre, G
514  results:
Search for persons X
?
1

Effect of Gamma Irradiation on Structure and Electrical Pro..:

, In: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP),
Mouaci, S. ; Griseri, V. ; Saidi-Amroun, N... - p. 1-4 , 2023
 
?
2

Electronic Properties of Polyethylene Naphthalate as Derive..:

, In: 2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP),
 
?
3

Electrical Conduction and Space Charge in Gamma-Irradiated ..:

Mouchache, C. ; Saidi-Amroun, N. ; Griseri, V...
IEEE Transactions on Dielectrics and Electrical Insulation.  30 (2023)  5 - p. 2099-2106 , 2023
 
?
4

Study of the Electrical Properties of Thin Silica Layers wi..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),
Rigoudy, C. ; Makasheva, K. ; Villeneuve-Faure, C... - p. 273-276 , 2022
 
?
5

Effect of Gamma-Irradiation on Creation and Dynamic of Spac..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),
Mezouar, A. ; Griseri, V. ; Saidi-Amroun, N... - p. 553-556 , 2022
 
?
6

Targeted Thermal and Electrical Properties of Rubber Materi..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),
Vu, T.T.N. ; Roy, S. Le ; Teyssedre, G. - p. 53-56 , 2022
 
?
7

Study of Trapping Process in BOPP by Coupled Space Charge a..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),
Mendoza-Lopez, D. ; Teyssedre, G. ; Berquez, L.. - p. 376-379 , 2022
 
?
 
?
9

Modelling the impact of electrode roughness on net charge d..:

Hoang, M Q ; Nguyen, M Q ; Vu, T T N..
Journal of Physics D: Applied Physics.  54 (2021)  30 - p. 305303 , 2021
 
?
11

Dielectric Properties and β-Relaxation in Cross-linked Poly..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Kemari, Y. ; Teyssedre, G. ; Mekhaldi, A.. - p. 73-76 , 2020
 
?
12

Electric Field and Current Conduction Modelling in Bi-layer..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Diaw, E. N. ; Roy, S. Le ; Teyssedre, G.. - p. 505-508 , 2020
 
?
13

Plasmon induced enhancement of the electroluminescence sign..:

, In: 2020 IEEE 20th International Conference on Nanotechnology (IEEE-NANO),
 
?
14

2D Charge Density Probing at Aluminum / SiNx Interface: a S..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Djaou, C. ; Villeneuve-Faure, C. ; Boudou, L... - p. 451-454 , 2020
 
?
15

Combined-PSD and LIMM Measurements for Traps Characterizati..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Boudou, L. ; Berquez, L. ; Teyssedre, G. - p. 371-374 , 2020
 
1-15