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1

Comprehensive physics-based modeling of post-cycling long-t..:

, In: 2024 IEEE International Memory Workshop (IMW),

Thakor, Karansingh ; Rangarajan, Nikhil ; Diwakar, Himanshu... - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

2

A TCAD to SPICE Framework for Isolation of BTI and HCD in G..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Thakor, Karansingh ; Chatterjee, Payel ; Mahapatra, Souvik - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

3

A Generic Framework for MOSFET Reliability—Part II: Gate an..:

Mahapatra, Souvik ; Diwakar, Himanshu ; Thakor, Karansingh...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 126-137 , 2024

Link: https://doi.org/10.1109/..

4

A Device to Circuit Framework for NBTI:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),

Chatterjee, Payel ; Thakor, Karansingh ; Bisht, Arnav Shaurya... - p. 1-6 , 2023

Link: https://doi.org/10.1109/..

5

Modeling of Channel Hot Electron Degradation in n-MOSFETs:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),

Thakor, Karansingh ; Diwakar, Himanshu ; Mahapatra, Souvik - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

6

Modeling of Classical Channel Hot Electron Degradation in n..:

Diwakar, Himanshu ; Thakor, Karansingh ; Mahapatra, Souvik
IEEE Transactions on Electron Devices. 69 (2022) 7 - p. 3596-3603 , 2022

Link: https://doi.org/10.1109/..

7

TCAD Framework to Estimate the NBTI Degradation in FinFET a..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),

Tiwari, Ravi ; Parihar, Narendra ; Thakor, Karansingh.. - p. 1-4 , 2019

Link: https://doi.org/10.1109/..

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