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Toguchi, Shintaro
6  results:
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1

Charge Trapping in Irradiated 3D Devices and ICs (Invited):

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Zhang, En Xia ; Toguchi, Shintaro ; Guo, Zi Xiang... - p. 10C.3-1-10C.3-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Total-Ionizing-Dose Effects on 3-D Sequentially Integrated ..:

Toguchi, Shintaro ; Zhang, En Xia ; Fleetwood, Daniel M....
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 627-633 , 2023
Link: https://doi.org/10.1109/..
 
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3

Effects of Layer-to-Layer Coupling on the Total-Ionizing-Do..:

Toguchi, Shintaro ; Zhang, En Xia ; Rony, Mohammed W....
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1420-1427 , 2022
Link: https://doi.org/10.1109/..
 
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4

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Dee..:

Rony, M. W. ; Zhang, En Xia ; Toguchi, Shintaro...
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 299-306 , 2022
Link: https://doi.org/10.1109/..
 
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5

One-Step Detection of the 2009 Pandemic Influenza A(H1N1) V..:

Kawai, Yuki ; Kimura, Yasumasa ; Lezhava, Alexander...
PLoS ONE.  7 (2012)  1 - p. e30236 , 2012
Link: https://doi.org/10.1371/..
 
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6

One-step detection of the 2009 pandemic influenza A(H1N1) v..:

Yuki Kawai ; Yasumasa Kimura ; Alexander Lezhava...
http://europepmc.org/articles/PMC3266250?pdf=render.  , 2012
Link: https://doi.org/10.1371/..
 
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