Tok, Kean Hong
43  results:
Search for persons X
?
 
?
2

Criteria for selecting statistical distribution for the Amp..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
 
?
5

Defect loss and its physical processes:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
 
?
8

Extracting statistical distributions of RTN originating fro..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),
Tok, Kean H. ; Zhang, Jian F. ; Brown, James.. - p. 1-4 , 2023
 
?
9

Characterizing and Modeling RTN Under Real Circuit Bias Con..:

Tok, Kean H. ; Zhang, Jian F. ; Brown, James...
IEEE Transactions on Electron Devices.  70 (2023)  5 - p. 2424-2430 , 2023
 
?
10

An Integral Methodology for Predicting Long-Term RTN:

Tok, Kean H. ; Mehedi, Mehzabeen ; Zhang, Jian F....
IEEE Transactions on Electron Devices.  69 (2022)  7 - p. 3869-3875 , 2022
 
?
11

AC RTN: Testing, Modeling, and Prediction:

Tok, Kean H. ; Zhang, Jian F. ; Brown, James...
IEEE Transactions on Electron Devices.  69 (2022)  10 - p. 5780-5786 , 2022
 
?
12

Symptomatic Spinal Epidural Lipomatosis After a Single Loca..:

Tok, Chung Hong ; Kaur, Shaleen ; Gangi, Afshin
CardioVascular and Interventional Radiology.  34 (2010)  S2 - p. 250-255 , 2010
 
?
13

Thermal Protection During Percutaneous Thermal Ablation Pro..:

Buy, Xavier ; Tok, Chung-Hong ; Szwarc, Daniel..
CardioVascular and Interventional Radiology.  32 (2009)  3 - p. 529-534 , 2009
 
1-15