Treberspurg, W.
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1

Erratum: Layout options of spectroscopic X-ray DEPFETs:

Treberspurg, W ; Andritschke, R ; Bähr, A...
Journal of Instrumentation.  15 (2020)  2 - p. e02001-e02001 , 2020
 
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2

Characterization of a 256 × 256 pixel DEPFET detector for t..:

Treberspurg, W. ; Andritschke, R. ; Behrens, A....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  958 (2020)  - p. 162555 , 2020
 
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3

Achievable time resolution of spectroscopic prototype DEPFE..:

Treberspurg, W. ; Hauser, G. ; Meidinger, N...
Journal of Instrumentation.  14 (2019)  3 - p. P03019-P03019 , 2019
 
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4

Layout options of spectroscopic X-ray DEPFETs:

Treberspurg, W. ; Andritschke, R. ; Bähr, A....
Journal of Instrumentation.  14 (2019)  8 - p. P08008-P08008 , 2019
 
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5

Test beam demonstration of silicon microstrip modules with ..:

Adam, W. ; Bergauer, T. ; Brondolin, E....
Journal of Instrumentation.  13 (2018)  3 - p. P03003-P03003 , 2018
 
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6

Measurement results of different options for spectroscopic ..:

Treberspurg, W. ; Andritschke, R. ; Hauser, G....
Journal of Instrumentation.  13 (2018)  9 - p. P09014-P09014 , 2018
 
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7

Performance study of spectroscopic DEPFET arrays with a pix..:

Müller-Seidlitz, J. ; Andritschke, R. ; Baehr, A....
Journal of Instrumentation.  13 (2018)  11 - p. P11018-P11018 , 2018
 
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8

Spectroscopic DEPFETs at high frame rates using window mode:

Müller-Seidlitz, J. ; Lechner, P. ; Meidinger, N..
Journal of Instrumentation.  13 (2018)  12 - p. P12021-P12021 , 2018
 
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10

Trapping in proton irradiated p+-n-n+silicon sensors at flu..:

Adam, W. ; Bergauer, T. ; Dragicevic, M....
Journal of Instrumentation.  11 (2016)  4 - p. P04023-P04023 , 2016
 
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11

Developing silicon strip detectors with a large-scale comme..:

König, A. ; Bartl, U. ; Bergauer, T....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  824 (2016)  - p. 419-421 , 2016
 
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12

The spatial potential and electric field distribution of ir..:

Treberspurg, W. ; Bergauer, T. ; Dragicevic, M...
Journal of Instrumentation.  10 (2015)  9 - p. P09012-P09012 , 2015
 
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13

Results of an electron beam test with prototype silicon sen..:

Treberspurg, W. ; Bartl, U. ; Bergauer, T....
Journal of Instrumentation.  10 (2015)  5 - p. C05007-C05007 , 2015
 
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14

A spreading resistance based method of mapping the resistiv..:

Treberspurg, W.
Journal of Instrumentation.  10 (2015)  8 - p. P08006-P08006 , 2015
 
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15

Optimizing the quality of silicon strip sensors produced by..:

Treberspurg, W ; Bartl, U ; Bergauer, T...
Journal of Instrumentation.  9 (2014)  1 - p. C01051-C01051 , 2014
 
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