Treis, J.
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2

Erratum: Layout options of spectroscopic X-ray DEPFETs:

Treberspurg, W ; Andritschke, R ; Bähr, A...
Journal of Instrumentation.  15 (2020)  2 - p. e02001-e02001 , 2020
 
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3

DANAE: A new effort to directly search for dark matter with..:

Kluck, H. ; Bähr, A. ; Ninkovic, J....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  958 (2020)  - p. 162155 , 2020
 
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4

Layout options of spectroscopic X-ray DEPFETs:

Treberspurg, W. ; Andritschke, R. ; Bähr, A....
Journal of Instrumentation.  14 (2019)  8 - p. P08008-P08008 , 2019
 
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5

Performance study of spectroscopic DEPFET arrays with a pix..:

Müller-Seidlitz, J. ; Andritschke, R. ; Baehr, A....
Journal of Instrumentation.  13 (2018)  11 - p. P11018-P11018 , 2018
 
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7

High resolution X-ray imaging with pnCCDs:

Schopper, Florian ; Ninkovic, J. ; Richter, R....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  912 (2018)  - p. 11-15 , 2018
 
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8

Advanced DePFET concepts: Quadropix:

Baehr, Alexander ; Feller, A. ; Lechner, P....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  912 (2018)  - p. 70-74 , 2018
 
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9

DEPFET detectors for direct detection of MeV Dark Matter pa..:

Bähr, A. ; Kluck, H. ; Ninkovic, J...
The European Physical Journal C.  77 (2017)  12 - p. , 2017
 
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10

Characterization and optimization of a thin direct electron..:

Dourki, I. ; Westermeier, F. ; Schopper, F....
Journal of Instrumentation.  12 (2017)  3 - p. C03047-C03047 , 2017
 
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11

Spectral performance of DEPFET and gateable DEPFET macropix..:

Bähr, A ; Aschauer, S ; Bergbauer, B...
Journal of Instrumentation.  9 (2014)  3 - p. P03018-P03018 , 2014
 
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13

Electrical characterization of different DEPFET designs on ..:

Bergbauer, B ; Aschauer, S ; Bähr, A...
Journal of Instrumentation.  9 (2014)  1 - p. C01020-C01020 , 2014
 
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15

First Measurement Results of new SDD Detectors with DEPFET ..:

Treis, J. ; Bähr, A. ; Eckhardt, R....
Microscopy and Microanalysis.  19 (2013)  S2 - p. 1276-1277 , 2013
 
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