E-LIB Suche - Ergebnisse für: Trinh, Thanh Thuy

1

Gate bias stress reliability of a-InGaZnO TFTs under variou..:

Cho, Jaewoong ; Choi, Jiwon ; Nguyen, Minh Phuong...
Microelectronics Reliability. 153 (2024) - p. 115308 , 2024

Link: https://doi.org/10.1016/..

2

The Impact of the Micro-Structure within Passivated Layers ..:

Lee, Sunhwa ; Park, Jinjoo ; Pham, Duy Phong...
Energies. 16 (2023) 18 - p. 6694 , 2023

Link: https://doi.org/10.3390/..

3

A study on the influence of the albedo spectrum on the bifa..:

Lee, Sunhwa ; Trinh, Thanh Thuy ; Pham, Duy Phong...
Solar Energy. 227 (2021) - p. 490-496 , 2021

Link: https://doi.org/10.1016/..

4

Over 30% efficiency bifacial 4-terminal perovskite-heteroju..:

Kim, Sangho ; Trinh, Thanh Thuy ; Park, Jinjoo...
Scientific Reports. 11 (2021) 1 - p. , 2021

Link: https://doi.org/10.1038/..

5

Carrier transport mechanisms of reactively direct current m..:

Dao, Vinh-Ai ; Trinh, Thanh Thuy ; Kim, Sangho...
Journal of Power Sources. 472 (2020) - p. 228460 , 2020

Link: https://doi.org/10.1016/..

6

Effects of oxidation state on photovoltaic properties of re..:

Tran, Tuan Anh ; Trinh, Thanh Thuy ; Viet, Truong Doan...
Semiconductor Science and Technology. 35 (2020) 4 - p. 045020 , 2020

Link: https://doi.org/10.1088/..

7

The recorded open-circuit voltage and fill factor achieveme..:

Kim, Sangho ; Dao, Vinh Ai ; Trinh, Thanh Thuy...
Semiconductor Science and Technology. 34 (2019) 6 - p. 065004 , 2019

Link: https://doi.org/10.1088/..

8

In Situ Process to Form Passivated Tunneling Oxides for Fro..:

Lee, Sunhwa ; Trinh, Thanh Thuy ; Pham, Duy Phong...
ACS Sustainable Chemistry & Engineering. 7 (2019) 24 - p. 19332-19337 , 2019

Link: https://doi.org/10.1021/..

9

Role of SiOxNy surface passivation layer on stability impro..:

Trinh, Thanh Thuy ; Jang, Kyungsoo ; Nguyen, Van Duy..
Microelectronic Engineering. 164 (2016) - p. 14-19 , 2016

Link: https://doi.org/10.1016/..

10

Role of Schottky barrier height at source/drain contact for..:

Trinh, Thanh Thuy ; Jang, Kyungsoo ; Velumani, S...
Materials Science in Semiconductor Processing. 38 (2015) - p. 50-56 , 2015

Link: https://doi.org/10.1016/..

11

High performance non-volatile memory with the control of ch..:

Nguyen, Cam Phu Thi ; Trinh, Thanh Thuy ; Raja, Jayapal...
Semiconductor Science and Technology. 30 (2015) 7 - p. 075009 , 2015

Link: https://doi.org/10.1088/..

12

Source/drain metallization effects on the specific contact ..:

Nguyen, Cam Phu Thi ; Trinh, Thanh Thuy ; Raja, Jayapal...
Materials Science in Semiconductor Processing. 39 (2015) - p. 649-653 , 2015

Link: https://doi.org/10.1016/..

13

Effect of high conductivity amorphous InGaZnO active layer ..:

Trinh, Thanh Thuy ; Jang, Kyungsoo ; Dao, Vinh Ai.
Journal of Applied Physics. 116 (2014) 21 - p. , 2014

Link: https://doi.org/10.1063/..

14

Trapping Time Characteristics of Carriers in a-InGaZnO Thin..:

Dao, Vinh Ai ; Trinh, Thanh Thuy ; Jang, Kyungsoo..
Journal of Electronic Materials. 42 (2013) 4 - p. 711-715 , 2013

Link: https://doi.org/10.1007/..

15

Bias–stress-induced threshold voltage shift dependence of n..:

Nguyen, Cam Phu Thi ; Trinh, Thanh Thuy ; Dao, Vinh Ai...
Semiconductor Science and Technology. 28 (2013) 10 - p. 105014 , 2013

Link: https://doi.org/10.1088/..