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2019 24th Asia and South Pacific Design Automation Conference (ASP-DAC) ,
1
Improving Scan Chain Diagnostic Accuracy Using Multi-Stage ..:
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Proceedings of the 24th Asia and South Pacific Design Automation Conference ,
2
Improving scan chain diagnostic accuracy using multi-stage ..:
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition ,
3
Feedback-bus oscillation ring : a general architecture f..:
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Proceedings of the 49th Annual Design Automation Conference ,
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Small delay testing for TSVs in 3-D ICs:
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2019 IEEE International Test Conference in Asia (ITC-Asia) ,
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Race and Glitch Handling: A Test Perspective:
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2019 IEEE 28th Asian Test Symposium (ATS) ,
7
TEA: A Test Generation Algorithm for Designs with Timing Ex..:
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Proceedings of the International Conference on Computer-Aided Design ,
8
A scalable quantitative measure of IR-drop effects for scan..:
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Proceedings of the 2010 Asia and South Pacific Design Automation Conference ,
9
Improved weight assignment for logic switching activity dur..:
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Proceedings of the 44th annual Design Automation Conference ,
10
Test generation in the presence of timing exceptions and co..:
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Proceedings of the 7th International Symposium on Quality Electronic Design ,
11
Delay Fault Diagnosis for Non-Robust Test:
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2023 Asia-Pacific Microwave Conference (APMC) ,
15
Ka-band/E-band 4096-QAM CMOS TRx Development:
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