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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
1
An Add-in Test Structure Chip to Unitedly Assess PVD Materi..:
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2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) ,
2
Test Structure of Bi-stable Spring towards TopoMEMS Ising M..:
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Sixth International Conference on Creating, Connecting and Collaborating through Computing (C5 2008) ,
8