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Tsunemi, Eika
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1

Fabrication and Characterization of Floating Memory Devices..:

Hirata, Naoyuki ; Sato, Minako ; Tsunemi, Eika...
The Journal of Physical Chemistry C.  121 (2016)  20 - p. 10638-10644 , 2016
Link: https://doi.org/10.1021/..
 
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2

Twin‐Probe Atomic Force Microscopy with Optical Beam Deflec..:

SATOH, NOBUO ; TSUNEMI, EIKA ; KOBAYASHI, KEI...
Electronics and Communications in Japan.  99 (2016)  9 - p. 92-100 , 2016
Link: https://doi.org/10.1002/..
 
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3

Hard x-ray photoelectron spectroscopy using an environmenta..:

Tsunemi, Eika ; Watanabe, Yoshio ; Oji, Hiroshi...
Journal of Applied Physics.  117 (2015)  23 - p. , 2015
Link: https://doi.org/10.1063/..
 
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4

Multi-Probe Atomic Force Microscopy Using Piezo-Resistive C..:

Satoh, Nobuo ; Tsunemi, Eika ; Kobayashi, Kei..
e-Journal of Surface Science and Nanotechnology.  11 (2013)  0 - p. 13-17 , 2013
Link: https://doi.org/10.1380/..
 
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5

Development of multi-environment dual-probe atomic force mi..:

Tsunemi, Eika ; Kobayashi, Kei ; Oyabu, Noriaki...
Review of Scientific Instruments.  84 (2013)  8 - p. , 2013
Link: https://doi.org/10.1063/..
 
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6

Visualization of Charge Injection Processes in Polydiacetyl..:

Hirose, Masaharu ; Tsunemi, Eika ; Kobayashi, Kei.
Japanese Journal of Applied Physics.  52 (2013)  8R - p. 085201 , 2013
Link: https://doi.org/10.7567/..
 
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7

Influence of grain boundary on electrical properties of org..:

Hirose, Masaharu ; Tsunemi, Eika ; Kobayashi, Kei.
Applied Physics Letters.  103 (2013)  17 - p. , 2013
Link: https://doi.org/10.1063/..
 
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8

Investigation of Lanthanide Sandwich Nanoclusters Encapsula..:

Tsunemi, Eika ; Tsuji, Takashi ; Fukazawa, Suguru...
Applied Physics Express.  5 (2012)  3 - p. 035202 , 2012
Link: https://doi.org/10.1143/..
 
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9

Development of dual-probe atomic force microscopy system us..:

Tsunemi, Eika ; Kobayashi, Kei ; Matsushige, Kazumi.
Review of Scientific Instruments.  82 (2011)  3 - p. , 2011
Link: https://doi.org/10.1063/..
 
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10

Investigations of Local Electrical Properties of Pentacene ..:

Hirose, Masaharu ; Tsunemi, Eika ; Kobayashi, Kei..
Japanese Journal of Applied Physics.  49 (2010)  8S3 - p. 08LB10 , 2010
Link: https://doi.org/10.1143/..
 
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11

Multi-Probe Atomic Force Microscopy Using Piezoelectric Can..:

Satoh, Nobuo ; Tsunemi, Eika ; Miyato, Yuji...
Japanese Journal of Applied Physics.  46 (2007)  8S - p. 5543 , 2007
Link: https://doi.org/10.1143/..
 
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12

Multi-Probe Atomic Force Microscopy with Optical Beam Defle..:

Tsunemi, Eika ; Satoh, Nobuo ; Miyato, Yuji...
Japanese Journal of Applied Physics.  46 (2007)  8S - p. 5636 , 2007
Link: https://doi.org/10.1143/..
 
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