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Tsunemi, Eika
12
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1
Fabrication and Characterization of Floating Memory Devices..:
Hirata, Naoyuki
;
Sato, Minako
;
Tsunemi, Eika
...
The Journal of Physical Chemistry C. 121 (2016) 20 - p. 10638-10644 , 2016
Link:
https://doi.org/10.1021/..
?
2
Twin‐Probe Atomic Force Microscopy with Optical Beam Deflec..:
SATOH, NOBUO
;
TSUNEMI, EIKA
;
KOBAYASHI, KEI
...
Electronics and Communications in Japan. 99 (2016) 9 - p. 92-100 , 2016
Link:
https://doi.org/10.1002/..
?
3
Hard x-ray photoelectron spectroscopy using an environmenta..:
Tsunemi, Eika
;
Watanabe, Yoshio
;
Oji, Hiroshi
...
Journal of Applied Physics. 117 (2015) 23 - p. , 2015
Link:
https://doi.org/10.1063/..
?
4
Multi-Probe Atomic Force Microscopy Using Piezo-Resistive C..:
Satoh, Nobuo
;
Tsunemi, Eika
;
Kobayashi, Kei
..
e-Journal of Surface Science and Nanotechnology. 11 (2013) 0 - p. 13-17 , 2013
Link:
https://doi.org/10.1380/..
?
5
Development of multi-environment dual-probe atomic force mi..:
Tsunemi, Eika
;
Kobayashi, Kei
;
Oyabu, Noriaki
...
Review of Scientific Instruments. 84 (2013) 8 - p. , 2013
Link:
https://doi.org/10.1063/..
?
6
Visualization of Charge Injection Processes in Polydiacetyl..:
Hirose, Masaharu
;
Tsunemi, Eika
;
Kobayashi, Kei
.
Japanese Journal of Applied Physics. 52 (2013) 8R - p. 085201 , 2013
Link:
https://doi.org/10.7567/..
?
7
Influence of grain boundary on electrical properties of org..:
Hirose, Masaharu
;
Tsunemi, Eika
;
Kobayashi, Kei
.
Applied Physics Letters. 103 (2013) 17 - p. , 2013
Link:
https://doi.org/10.1063/..
?
8
Investigation of Lanthanide Sandwich Nanoclusters Encapsula..:
Tsunemi, Eika
;
Tsuji, Takashi
;
Fukazawa, Suguru
...
Applied Physics Express. 5 (2012) 3 - p. 035202 , 2012
Link:
https://doi.org/10.1143/..
?
9
Development of dual-probe atomic force microscopy system us..:
Tsunemi, Eika
;
Kobayashi, Kei
;
Matsushige, Kazumi
.
Review of Scientific Instruments. 82 (2011) 3 - p. , 2011
Link:
https://doi.org/10.1063/..
?
10
Investigations of Local Electrical Properties of Pentacene ..:
Hirose, Masaharu
;
Tsunemi, Eika
;
Kobayashi, Kei
..
Japanese Journal of Applied Physics. 49 (2010) 8S3 - p. 08LB10 , 2010
Link:
https://doi.org/10.1143/..
?
11
Multi-Probe Atomic Force Microscopy Using Piezoelectric Can..:
Satoh, Nobuo
;
Tsunemi, Eika
;
Miyato, Yuji
...
Japanese Journal of Applied Physics. 46 (2007) 8S - p. 5543 , 2007
Link:
https://doi.org/10.1143/..
?
12
Multi-Probe Atomic Force Microscopy with Optical Beam Defle..:
Tsunemi, Eika
;
Satoh, Nobuo
;
Miyato, Yuji
...
Japanese Journal of Applied Physics. 46 (2007) 8S - p. 5636 , 2007
Link:
https://doi.org/10.1143/..
1-12