Tu, Hong-Yu
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3

Ultrafast Electron Transfer in Binary Nanoparticle Superlat..:

Cheng, Ji-Chao ; Pan, Ling-Yun ; Tu, Hong-Yu...
physica status solidi (RRL) – Rapid Research Letters.  15 (2021)  7 - p. 2100066 , 2021
 
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The Characteristics and Reliability With Channel Length Dep..:

Kuo, Chuan-Wei ; Tsai, Tsung-Ming ; Chang, Ting-Chang...
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 268-274 , 2024
 
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9

Performance improvement of Zn0.5Mg0.5O UV sensor by supercr..:

Chien, Ya-Ting ; Tu, Hong-Yi ; Chen, Wen-Chung...
Materials Science in Semiconductor Processing.  158 (2023)  - p. 107343 , 2023
 
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11

Abnormal Degradation Behaviors Under Negative Bias Stress i..:

Wu, Chia-Chuan ; Ma, William Cheng-Yu ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1079-1084 , 2023
 
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12

Performance Improvement by Enhancing Passivation Layer of p..:

Chou, Sheng-Yao ; Wu, Pei-Yu ; Chen, Ming-Chen...
IEEE Electron Device Letters.  44 (2023)  2 - p. 213-216 , 2023
 
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13

Investigation of Electrical Characteristics in Low-Temperat..:

, In: 2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA),
 
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14

Improving Reliability of a-InGaZnO TFTs With Optimal Locati..:

Tu, Yu-Fa ; Chiang, Cheng-Ling ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  69 (2022)  6 - p. 3181-3185 , 2022
 
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