E-LIB Suche - Ergebnisse für: Tutsch, Rainer

1

A New Kind of Atomic Force Microscopy Scan Control Enabled ..:

Degenhardt, Johannes ; Bounaim, Mohammed Wassim ; Deng, Nan..
Nanomanufacturing and Metrology. 7 (2024) 1 - p. , 2024

2

On the importance of multi-material acceptance testing for ..:

Borges de Oliveira, Fabrício ; Bartscher, Markus ; Neuschaefer-Rube, Ulrich..
Precision Engineering. 82 (2023) - p. 184-198 , 2023

Link: https://doi.org/10.1016/..

3

A feasibility study towards traceable calibration of size a..:

Dai, Gaoliang ; Degenhardt, Johannes ; Hu, Xiukun...
Measurement Science and Technology. 34 (2023) 5 - p. 055009 , 2023

Link: https://doi.org/10.1088/..

4

Systematische Simulationsmethode zur effizienten Abschätzun..:

Degenhardt, Johannes ; Tutsch, Rainer ; Dai, Gaoliang
tm - Technisches Messen. 90 (2023) s1 - p. 27-32 , 2023

Link: https://doi.org/10.1515/..

5

Correction method for 3D non-linear drift distortions in at..:

Degenhardt, Johannes ; Tutsch, Rainer ; Dai, Gaoliang
Measurement Science and Technology. 34 (2022) 2 - p. 025001 , 2022

Link: https://doi.org/10.1088/..

6

Auslegung neuartiger Transferkörper für die Kalibrierung vo..:

Lehrmann, Katharina ; Härtig, Frank ; Tutsch, Rainer
tm - Technisches Messen. 89 (2022) 7-8 - p. 478-492 , 2022

Link: https://doi.org/10.1515/..

7

Numerical simulation for determining the measurement uncert..:

Lehrmann, Katharina ; Härtig, Frank ; Tutsch, Rainer
Measurement: Sensors. 24 (2022) - p. 100414 , 2022

Link: https://doi.org/10.1016/..

8

True 3D Nanometrology: 3D-Probing with a Cantilever-Based S..:

Thiesler, Jan ; Ahbe, Thomas ; Tutsch, Rainer.
Sensors. 22 (2021) 1 - p. 314 , 2021

Link: https://doi.org/10.3390/..

9

Simulated measurement-uncertainty determination for mass-st..:

Härtig, Frank ; Lehrmann, Katharina ; Tutsch, Rainer
Measurement: Sensors. 18 (2021) - p. 100090 , 2021

Link: https://doi.org/10.1016/..

10

Numerische Simulation zur Bestimmung der Messunsicherheit f..:

Lehrmann, Katharina ; Härtig, Frank ; Tutsch, Rainer
tm - Technisches Messen. 88 (2021) 2 - p. 90-102 , 2021

Link: https://doi.org/10.1515/..

11

True 3D-AFM sensor for nanometrology:

Thiesler, Jan ; Tutsch, Rainer ; Fromm, Karsten.
Measurement Science and Technology. 31 (2020) 7 - p. 074012 , 2020

Link: https://doi.org/10.1088/..

12

Intelligent fault detection of electrical assemblies using ..:

Schwebig, Alida Ilse Maria ; Tutsch, Rainer
Journal of Sensors and Sensor Systems. 9 (2020) 2 - p. 363-374 , 2020

Link: https://doi.org/10.5194/..

13

20. GMA/ITG-Fachtagung Sensoren und Messsysteme 2019:

Schütze, Andreas ; Tutsch, Rainer
tm - Technisches Messen. 87 (2020) 3 - p. 143-145 , 2020

Link: https://doi.org/10.1515/..

14

Compilation of training datasets for use ofconvolutional ne..:

Schwebig, Alida Ilse Maria ; Tutsch, Rainer
Journal of Sensors and Sensor Systems. 9 (2020) 1 - p. 167-178 , 2020

Link: https://doi.org/10.5194/..

15

Wellenlängenoptimierung bei Heterodyn-Phasenschiebeverfahre:

Petz, Marcus ; Dierke, Hanno ; Tutsch, Rainer
tm - Technisches Messen. 87 (2020) 10 - p. 599-613 , 2020

Link: https://doi.org/10.1515/..