Umezawa, Hitoshi
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5

Fabrication of the SiC Gate-All-Around JFET:

Mochizuki, Masaya ; Yamamoto, Masayuki ; Umezawa, Hitoshi.
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4612-4617 , 2023
 
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13

Comparison of thermal stabilities of p+-Si/p-diamond hetero..:

Uehigashi, Yota ; Ohmagari, Shinya ; Umezawa, Hitoshi...
Japanese Journal of Applied Physics.  61 (2022)  SF - p. SF1009 , 2022
 
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